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1.福州大学 物理与信息工程学院, 福建 福州 350108
2.福建江夏学院 电子信息科学学院, 福建 福州 350108
3.中国福建光电信息科学与技术创新实验室, 福建 福州 350108
Received:24 November 2022,
Revised:16 December 2022,
Published:05 May 2023
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SU Hao, LI Wen-hao, LI Jun-long, et al. Recent progress of wafer level Micro-LED chip inspection technology[J]. Chinese journal of liquid crystals and displays, 2023, 38(5): 582-594.
SU Hao, LI Wen-hao, LI Jun-long, et al. Recent progress of wafer level Micro-LED chip inspection technology[J]. Chinese journal of liquid crystals and displays, 2023, 38(5): 582-594. DOI: 10.37188/CJLCD.2022-0392.
随着微型氮化镓(GaN)发光二极管(LED)制造工艺的不断进步,Micro-LED显示有望成为新一代显示技术并在近眼显示、大尺寸高清显示器件、柔性屏幕等领域大放异彩。在Micro-LED显示众多技术环节中,晶圆级Micro-LED芯片的检测是实现坏点拦截,提升显示屏良品率、降低整机制造成本的关键环节。针对大数量(百万数量级)、小尺寸(<50 μm)的晶圆级Micro-LED芯片阵列,现有的电学检测手段存在检测效率低、成本高等缺点。因此,提高检测效率、提升检测准确度、降低检测成本是晶圆级Micro-LED检测技术的发展趋势。本文首先介绍了晶圆级Micro-LED芯片检测时所需要检测的几个指标,其次详细介绍并分析了现有的或已经提出的检测手段,最后对晶圆级Micro-LED芯片检测技术进行总结并展望了未来技术发展方向。
With the continuous progress in the manufacturing process of gallium nitride (GaN)-based light-emitting diodes (LEDs), Micro-LED display is considered as an emerging display technology, which has broad prospects for near-eye display, large-scale displays device, flexible display, and other fields. The inspection of wafer-level Micro-LED chips can improve the yield of the screens and reduce the manufacturing cost of displayers, which is one of the key technologies related to Micro-LED display. For the inspection needs of large quantity (millions of orders) and small size (<50 μm) of wafer-level Micro-LED chip arrays, the existing electrical inspection technology has the disadvantages of low inspection efficiency and high cost. Therefore, Micro-LED chips inspection technology with improving inspection efficiency, improving inspection accuracy, and reducing inspection cost is the future development trend. In this paper, several indicators required for Micro-LED chip inspection are summarized. Then, the existing or proposed inspection methods are introduced and analyzed in detail. Finally, the future development of inspection technology is prospected.
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