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Recent progress of wafer level Micro-LED chip inspection technology
Device Physics and Device Preparation | 更新时间:2023-05-09
    • Recent progress of wafer level Micro-LED chip inspection technology

    • Chinese Journal of Liquid Crystals and Displays   Vol. 38, Issue 5, Pages: 582-594(2023)
    • DOI:10.37188/CJLCD.2022-0392    

      CLC: TN364+.2;TN383+.1
    • Received:24 November 2022

      Revised:16 December 2022

      Published:05 May 2023

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  • SU Hao, LI Wen-hao, LI Jun-long, et al. Recent progress of wafer level Micro-LED chip inspection technology[J]. Chinese journal of liquid crystals and displays, 2023, 38(5): 582-594. DOI: 10.37188/CJLCD.2022-0392.

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