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Rainbow phenomenon in the punch-hole area of OLED displays caused by SiON thin films changes in TFE
Device Physics and Device Preparation | 更新时间：2026-04-14

    • Rainbow phenomenon in the punch-hole area of OLED displays caused by SiON thin films changes in TFE

    • Chinese Journal of Liquid Crystals and Displays   Vol. 41, Issue 3, Pages: 353-362(2026)

    • DOI：10.37188/CJLCD.2025-0240    

      CLC： TN27;TN383+.1
    • CSTR：32172.14.CJLCD.2025-0240    

    • Received：27 November 2025，

      Revised：2026-02-10，

      Published：05 March 2026

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  • CAI Hankun, YANG Jinjin, LI Zuobin, et al. Rainbow phenomenon in the punch-hole area of OLED displays caused by SiON thin films changes in TFE[J]. Chinese Journal of Liquid Crystals and Displays, 2026, 41(3): 353-362. DOI： 10.37188/CJLCD.2025-0240. CSTR： 32172.14.CJLCD.2025-0240.

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CAI Hankun
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