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Thickness characterization of inkjet-printed liquid crystal alignment films using TOF-SIMS depth profiling
Material Physics | 更新时间：2026-10-16

    • Thickness characterization of inkjet-printed liquid crystal alignment films using TOF-SIMS depth profiling

    • Chinese Journal of Liquid Crystals and Displays   Vol. 41, Issue 9, Pages: 1213-1222(2026)

    • DOI：10.3724/CJLCD.2026-0131    

      CLC： O436
    • CSTR：32172.14.CJLCD.2026-0131    

    • Received：15 July 2026，

      Revised：2026-08-29，

      Published：05 September 2026

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  • LIU Xiaoqing, CHEN Pan, LI Linling, et al. Thickness characterization of inkjet-printed liquid crystal alignment films using TOF-SIMS depth profiling[J]. Chinese Journal of Liquid Crystals and Displays, 2026, 41(9): 1213-1222. DOI： 10.3724/CJLCD.2026-0131. CSTR： 32172.14.CJLCD.2026-0131.

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CHEN Pan
LI Linling
TENG Chao
WANG Dan
MA Guo-jing
SONG Yong-zhi
YUAN Jian-feng
SHAO Xi-bin

Related Institution

Beijing BOE Display Technology Co. Ltd.
Weiyeda Technology （Jiangsu） Co. Ltd.
Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province， Key Lab of Modern Optical Technologies of Education Ministry of China， Soochow University
Collaborative Innovation Center of Suzhou Nano Science and Technology， School of Optoelectronic Science and Engineering， Soochow University
School of Physical Science and Technology， Nantong University
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