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Analysis of research status and development trends in oxide semiconductor thin-film transistors
Device Physics and Device Preparation | 更新时间:2026-05-19
    • Analysis of research status and development trends in oxide semiconductor thin-film transistors

    • Chinese Journal of Liquid Crystals and Displays   Vol. 41, Issue 4, Pages: 509-522(2026)
    • DOI:10.37188/CJLCD.2026-0036    

      CLC: TN321+.5
    • CSTR:32172.14.CJLCD.2026-0036    
    • Received:13 March 2026,

      Revised:2026-03-20,

      Published:05 April 2026

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  • XIONG Yuting, REN Junyan, LIANG Lingyan, et al. Analysis of research status and development trends in oxide semiconductor thin-film transistors[J]. Chinese Journal of Liquid Crystals and Displays, 2026, 41(4): 509-522. DOI: 10.37188/CJLCD.2026-0036. CSTR: 32172.14.CJLCD.2026-0036.

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Related Author

XIONG Yuting
REN Junyan
LIANG Lingyan
CAO Hongtao
LIANG Peng-xia
HE Ze-min
ZHANG Rui-yin
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Related Institution

University of Chinese Academy of Science
Laboratory of Atomic-scale and Micro & Nano Manufacturing, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences
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Technological Institute of Materials & Energy Science (TIMES), School of Electronic Information, Xijing University
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