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Analysis of research status and development trends in oxide semiconductor thin-film transistors
Device Physics and Device Preparation | 更新时间:2026-09-12
    • Analysis of research status and development trends in oxide semiconductor thin-film transistors

    • Chinese Journal of Liquid Crystals and Displays   Vol. 41, Issue 4, Pages: 509-522(2026)
    • DOI:10.37188/CJLCD.2026-0036    

      CLC: TN321+.5
    • CSTR:32172.14.CJLCD.2026-0036    
    • Received:13 March 2026,

      Revised:2026-03-20,

      Published:05 April 2026

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  • XIONG Yuting, REN Junyan, LIANG Lingyan, et al. Analysis of research status and development trends in oxide semiconductor thin-film transistors[J]. Chinese Journal of Liquid Crystals and Displays, 2026, 41(4): 509-522. DOI: 10.37188/CJLCD.2026-0036. CSTR: 32172.14.CJLCD.2026-0036.

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Related Author

XIONG Yuting
REN Junyan
LIANG Lingyan
CAO Hongtao
LIANG Peng-xia
HE Ze-min
ZHANG Rui-yin
MIAO Zong-cheng

Related Institution

University of Chinese Academy of Science
Laboratory of Atomic-scale and Micro & Nano Manufacturing, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences
BOE Technology Group Co., Ltd.
School of Artificial Intelligence, Optics and Electronics (iOPEN), Northwestern Polytechnical University
Technological Institute of Materials & Energy Science (TIMES), School of Electronic Information, Xijing University
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