电场对负性向列相液晶薄盒影响的研究

张晶; 陈思博; 孙洋; 张志东

doi:10.3788/YJYXS20173203.0196

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电场对负性向列相液晶薄盒影响的研究

材料与器件 | 更新时间：2020-07-07

- 电场对负性向列相液晶薄盒影响的研究
- Influence of electric field on the thin negative namatic liquid crystal cell
- 液晶与显示 2017年32卷第3期页码：196-205
- 作者机构：
  
  河北工业大学理学院, 天津 300401
- 作者简介：
  
  [ "张晶(1992-),女,河北保定人,硕士研究生,从事液晶物理方面的学习和研究。E-mail:617758346@qq.com" ]
  E-mail:zhidong_zhang1961@163.com
- 基金信息：
  
  国家自然科学基金(No.11374087);the Natural Science Foundation of China(No.11374087)
- DOI：10.3788/YJYXS20173203.0196
  中图分类号： O753.2
- 收稿日期：2016-11-24，
  
  录用日期：2016-12-22，
  
  纸质出版日期：2017-03
- 稿件说明：
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张晶, 陈思博, 孙洋, 等. 电场对负性向列相液晶薄盒影响的研究[J]. 液晶与显示, 2017,32(3):196-205.

Jing ZHANG, Si-bo CHEN, Yang SUN, et al. Influence of electric field on the thin negative namatic liquid crystal cell[J]. Chinese journal of liquid crystals and displays, 2017, 32(3): 196-205.
张晶, 陈思博, 孙洋, 等. 电场对负性向列相液晶薄盒影响的研究[J]. 液晶与显示, 2017,32(3):196-205. DOI： 10.3788/YJYXS20173203.0196.

Jing ZHANG, Si-bo CHEN, Yang SUN, et al. Influence of electric field on the thin negative namatic liquid crystal cell[J]. Chinese journal of liquid crystals and displays, 2017, 32(3): 196-205. DOI： 10.3788/YJYXS20173203.0196.

摘要

基于Landau-de Gennes理论，利用松弛迭代法，研究了电场对垂直排列（VA）液晶薄盒和反扭曲向列相（ITN）液晶薄盒的影响。两系统在相同条件下的倾角变化相同，且系统双轴性与本征值的变化只取决于倾角的变化。研究表明，当盒厚大于一定临界值时，液晶系统一直处于正序参数态，此时ITN 薄盒的扭曲角由线性排列逐渐变化到呈45°角排列；当小于此临界盒厚时，在一定电压下会出现负序参数单轴态，此时ITN薄盒的扭曲角会偏离线性变化出现回滞。

Abstract

Based on the Landau-de Gennes theory

the influence of electric field on the state of liquid crystal (LC) within the thin vertical aligned (VA) cell and the thin inverse twist nematic (ITN) cell has been investigated

using the relaxation iterative method. Two systems have the same tilt angle behavior under the same electric field and same cell gap. Meanwhile

the variation of biaxialities and eigenvalues only depend on the tilt angle. When the cell gap is bigger than a critical gap

the LC system has positive order parameter

and the twist angle of ITN changes from lineation to nearly 45° with the increase of electric field. When the cell gap is under the critical value

a negative order parameter uniaxial state will appear at a certain electric field. The variation of the twist angle in the ITN cell shows a deviation from lineation as the electric filed increasing

and this variation will show a hysteresis effect within a certain electric field range.

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references

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