TFT-LCD关机横纹缺陷分析

路林林; 徐帅

doi:10.3788/YJYXS20112604.0464

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TFT-LCD关机横纹缺陷分析

器件制备技术及器件物理 | 更新时间：2020-08-12

- TFT-LCD关机横纹缺陷分析
- Analysis of Horizontal Block Stripe in TFT-LCD Panel in Switching-off Process
- 液晶与显示 2011年26卷第4期页码：464-468
- 作者机构：
  
  北京京东方光电科技有限公司北京,100176
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20112604.0464
  中图分类号： TN27
- 收稿日期：2010-03-11，
  
  修回日期：2010-04-08，
  
  网络出版日期：2011-08-20，
  
  纸质出版日期：2011-08-20
- 稿件说明：
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路林林, 徐帅. TFT-LCD关机横纹缺陷分析[J]. 液晶与显示, 2011,26(4): 464-468

LU Lin-lin, XU Shuai. Analysis of Horizontal Block Stripe in TFT-LCD Panel in Switching-off Process[J]. , 2011,26(4): 464-468
路林林, 徐帅. TFT-LCD关机横纹缺陷分析[J]. 液晶与显示, 2011,26(4): 464-468 DOI： 10.3788/YJYXS20112604.0464.

LU Lin-lin, XU Shuai. Analysis of Horizontal Block Stripe in TFT-LCD Panel in Switching-off Process[J]. , 2011,26(4): 464-468 DOI： 10.3788/YJYXS20112604.0464.

摘要

利用输出信号波形及偏压测试方法对TFT-LCD产品关机过程中发生的横纹不良进行了分析。分析结果表明

不良与像素电极放电效率相关。在此基础上提出了两种改善方法:一是通过改善TFT特性提高电极充放电能力;二是通过添加reset驱动电路实现像素电极同时放电。试验结果表明

放电效率的提升对于改善横纹缺陷效果明显

其中后者可完全消除不良现象。

Abstract

The horizontal block stripe

as an image quality defect

was analyzed by means of output signals and bias voltage stress (BVS) test. The results showed that the defect was correlated with discharging efficiency. Further

two approaches were proposed

one was to improve TFT characteristic

the other was to add reset function. The combined experiments indicated that discharging promotion can improve the defect. Especially the latter is most optimal to eliminate the phenomenon.

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Keywords

references

Uchida T,Ishinable T. Progress of the high performance LCD[C]Proceedings of IDW08,Niigata,Japan:International Display Workshops,2008:1531-1534.[2] Hong Sunkwang,Oh Jaeho,Park Poyun,et al. Enhancement of motion image quality in LCDs[C] SID04 Symposium Digest,San Jose,USA:SID,2004:1353-1355.[3] De Ridder H. Image processing and the problem of quantifying image quality[C]ICIP 2001 Proceedings,Thessa-loniki,Greece:IEEE Signal Processing Society,2001:3-6.[4] Lin L,Liang B J. Charge-discharge identified time extension driving method[C]SID06 Symposium Digest,San Francisco,USA:SID,2006:370-373.[5] Miwa K,Maekawa Y,Tsujimura T. Vth shift overcompensation in AMOLEDs for differential aging compensation[C]SID09 Symposium Digest,Texas,USA:SID,2009:1148-1151.

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