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1.中国科学院 空天信息创新研究院 传感技术国家重点实验室, 北京 100190
2.中国科学院大学 电子电气与通信工程学院, 北京 100049
3.中国科学院大学 光电学院, 北京 100049
[ "吴静宁(1996—),女,福建福州人,硕士研究生,2019年于北京科技大学获得学士学位,主要从事表面电磁模式共振成像传感器与系统的研究。E-mail:wujingning19@mails.ucas.edu.cn" ]
[ "祁志美(1967—),男,内蒙古丰镇人,博士,研究员,2001年于日本横滨国立大学获得博士学位,主要从事环境监测光波导传感材料、器件及系统,高光谱表面电磁模式共振成像传感技术,光MEMS麦克风与声定位微系统方面的研究。E-mail:zhimei-qi@mail.ie.ac.cn" ]
收稿日期:2022-02-16,
修回日期:2022-03-09,
纸质出版日期:2022-09-05
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吴静宁, 刘紫威, 杨博, 等. 聚苯乙烯微球的表面等离子体共振图像处理与分析[J]. 液晶与显示, 2022,37(9):1174-1181.
WU Jing-ning, LIU Zi-wei, YANG Bo, et al. Processing and analysis of surface plasmon resonance image of polystyrene microspheres[J]. Chinese journal of liquid crystals and displays, 2022, 37(9): 1174-1181.
吴静宁, 刘紫威, 杨博, 等. 聚苯乙烯微球的表面等离子体共振图像处理与分析[J]. 液晶与显示, 2022,37(9):1174-1181. DOI: 10.37188/CJLCD.2022-0057.
WU Jing-ning, LIU Zi-wei, YANG Bo, et al. Processing and analysis of surface plasmon resonance image of polystyrene microspheres[J]. Chinese journal of liquid crystals and displays, 2022, 37(9): 1174-1181. DOI: 10.37188/CJLCD.2022-0057.
使用高光谱SPRi传感器对聚苯乙烯微球进行SPR显微成像,并对不同偏振条件下采集的高光谱SPR图像数据进行了处理,有效削弱了SPR高光谱图像中固有污点的对比度,使得聚苯乙烯微球样品的位置与轮廓更加清晰。处理后的单像素SPR光谱变得平滑,降低了光源光谱本身特性以及随机噪声对SPR共振信息提取的影响。对比聚苯乙烯微球的SPR图像与反射式明场显微图像,发现二者存在明显区别,主要是由于消逝场穿透深度的限制。结果表明,相较于反射式明场显微图像,SPR图像可以明显反映出消逝场内微粒与金属表面的接触情况,但无法量化超出消逝场穿透深度的物体的真实尺寸。
The hyperspectral SPRi sensor was used to perform microscopic analysis of polystyrene microspheres, and the hyperspectral SPR data collected under different polarization conditions were processed, resulting in effective suppression of the contrast of inherent stains in the SPR hyperspectral images and making the position and outline of the polystyrene microsphere sample clearer. The processed SPR spectra become smooth, reducing the influence of the spectral characteristics of the light source and random noise on the SPR resonance information extraction. By comparing the SPR image of polystyrene microspheres with the reflection bright field microscopic image, it is found that there are obvious differences between the two images. The main reason is the limitation of the penetration depth of the evanescent field. The results show that SPR images can clearly reflect the contact between particles and metal surfaces in the evanescent field, but cannot quantify the true size of objects beyond the penetration depth of the evanescent field compared with reflection bright field microscopy images.
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