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PCB defect detection algorithm based on improved DEIM
Image Processing | 更新时间：2026-06-12

    • PCB defect detection algorithm based on improved DEIM

    • Chinese Journal of Liquid Crystals and Displays   Vol. 41, Issue 5, Pages: 700-716(2026)

    • DOI：10.37188/CJLCD.2026-0045    

      CLC： TP391
    • CSTR：32172.14.CJLCD.2026-0045    

    • Received：19 March 2026，

      Revised：2026-04-15，

      Published：05 May 2026

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  • GAO Xue, YUAN Fei, HUO Yanfei. PCB defect detection algorithm based on improved DEIM[J]. Chinese Journal of Liquid Crystals and Displays, 2026, 41(5): 700-716. DOI： 10.37188/CJLCD.2026-0045. CSTR： 32172.14.CJLCD.2026-0045.

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