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Development of AOI inspection of Mura defects on TFT-LCD surface
Liquid Crystal Optics | 更新时间：2024-11-28

    • Development of AOI inspection of Mura defects on TFT-LCD surface

    • “In the field of LCD display quality inspection, machine vision technology has become the main means due to its high efficiency and low cost advantages. This article focuses on the application of artificial intelligence technology in detecting Mura defects on TFT-LCD surfaces, and looks forward to the development trend of the technology.”
    • Chinese Journal of Liquid Crystals and Displays   Vol. 39, Issue 11, Pages: 1463-1476(2024)

    • DOI：10.37188/CJLCD.2024-0235    

      CLC： TP391.41

    • Received：14 August 2024，

      Revised：08 September 2024，

      Published：05 November 2024

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  • CHEN Zekang, SHEN Yi, ZHAI Chenyang, et al. Development of AOI inspection of Mura defects on TFT-LCD surface[J]. Chinese journal of liquid crystals and displays, 2024, 39(11): 1463-1476. DOI： 10.37188/CJLCD.2024-0235.

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