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合肥京东方光电科技有限公司, 安徽 合肥 230012
[ "王效坤(1988-), 男, 安徽亳州人, 学士, 高级工程师, 2010年于合肥工业大学获得学士学位, 主要从事薄膜制备工艺及TFT器件性能的研究。E-mail: wangxiaokun@boe.com.cn" ]
收稿日期:2019-09-09,
修回日期:2019-11-11,
录用日期:2019-11-11,
纸质出版日期:2020-03-05
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王效坤, 房伟华, 刘飞. 磁控溅射法制备的MoO
Xiao-kun WANG, Wei-hua FANG, Fei LIU. Properties of MoO
王效坤, 房伟华, 刘飞. 磁控溅射法制备的MoO
Xiao-kun WANG, Wei-hua FANG, Fei LIU. Properties of MoO
MoO
x
材料因其较低的反射率,在窄边框液晶显示技术等领域是一种理想的材料。本文利用磁控溅射法在玻璃基板上制备MoO
x
薄膜,并在MoO
x
薄膜上沉积不同的金属层,采用不同的方法研究MoO
x
薄膜及其搭配金属层的特性。测试结果表明:MoO
x
和玻璃基板的粘附性较好,无须打底膜可在玻璃基板上直接沉积;MoO
x
和Al及Cu的粘附效果优于Mo及MTD等Mo合金;MoO
x
薄膜的方块电阻值较大,搭配金属层时可忽略不计;MoO
x
厚度对搭配金属膜的反射率及色差影响很大,而金属层厚度影响较小。对于采用MoO
x
作低反材料的工艺,可以根据MoO
x
材料的特性选择搭配不同的金属层,在满足反射率等要求的基础上,可通过调整MoO
x
层厚度来调整产品的色差,以满足客户的颜色喜好需求。
MoO
x
thin film is considered to be an ideal choice in border-less TFT LCD for its low reflectivity. In this work
MoO
x
thin films are deposited at room temperature by utilizing magnetron sputtering on glass substrate. The properties of MoO
x
films
composite films of MoO
x
and different metal films are studied by different methods. The results show that MoO
x
film can be deposited on glass substrates without undercoating because of the good adhesion between them. The adhesion of MoO
x
to Al and Cu is better than that of Mo and Mo alloys
such as MTD. The square resistance of MoO
x
thin film is large and can be neglected when it is composed with metal layers. The thickness of MoO
x
has a great influence on the reflectivity of composite films of MoO
x
and metal film. Different MoO
x
thicknesses show different colors when it is composed with metal layers while the thickness of metal layer has little effect on color. In the production of border-less TFT LCD
metal layer can be choose according to the properties of MoO
x
to match with and the color of products can be adjusted by changing the thickness of MoO
x
layers to meet the color preferences of the customers on the basis of meeting the requirements of reflectivity.
毛 赣如 , 原 小杰 . 等离子体增强CVD氮化硅作硅太阳电池的减反射膜 . 太阳能学报 , 1988 . 9 ( 3 ): 286 - 290 . http://www.cnki.com.cn/Article/CJFDTotal-TYLX198803006.htm http://www.cnki.com.cn/Article/CJFDTotal-TYLX198803006.htm .
G R MAO , X J YUAN . Plasma-enhanced CVD silicon nitride as antireflection coating of silicon solar cells . Acta Energiae Solaris Sinica , 1988 . 9 ( 3 ): 286 - 290 . http://www.cnki.com.cn/Article/CJFDTotal-TYLX198803006.htm http://www.cnki.com.cn/Article/CJFDTotal-TYLX198803006.htm .
刘 光友 , 谭 兴文 , 姚 金才 , 等 . 电化学制备薄黑硅抗反射膜 . 物理学报 , 2008 . 57 ( 1 ): 514 - 518 . DOI: 10.3321/j.issn:1000-3290.2008.01.082 http://doi.org/10.3321/j.issn:1000-3290.2008.01.082 .
G Y LIU , X W TAN , J C YAO , 等 . "Black silicon" antireflection thin film prepared by electrochemical etching . Acta Physica Sinica , 2008 . 57 ( 1 ): 514 - 518 . DOI: 10.3321/j.issn:1000-3290.2008.01.082 http://doi.org/10.3321/j.issn:1000-3290.2008.01.082 .
仲 正中 , ABILEAH A , HOGAN J P , 等 . 彩色TFT-LCD用超低反射有机黑矩阵 . 现代显示 , 1998 . ( 4 ): 4 - 10 . http://www.cqvip.com/Main/Detail.aspx?id=3376752 http://www.cqvip.com/Main/Detail.aspx?id=3376752 .
ZZ ZHONG , A ABILEAH , J P HOGAN , 等 . Ultra-low reflectance organic black matrix for color TFT-LCDs . Advanced Display , 1998 . ( 4 ): 4 - 10 . http://www.cqvip.com/Main/Detail.aspx?id=3376752 http://www.cqvip.com/Main/Detail.aspx?id=3376752 .
张 一文 , 王 品红 , 廖 柯 . 超辐射发光二极管抗反射膜的设计 . 光学与光电技术 , 2005 . 3 ( 6 ): 32 - 34 . DOI: 10.3969/j.issn.1672-3392.2005.06.010 http://doi.org/10.3969/j.issn.1672-3392.2005.06.010 .
Y W ZHANG , P H WANG , K LIAO . Design of antireflection coating for superluminescent diodes . Optics & Optoelectronic Technology , 2005 . 3 ( 6 ): 32 - 34 . DOI: 10.3969/j.issn.1672-3392.2005.06.010 http://doi.org/10.3969/j.issn.1672-3392.2005.06.010 .
顾 铁儿 , 鲁 毅伟 , 仲 正中 , 等 . 航空电子设备用低反射高透射宽视角TFT-LCD . 现代显示 , 1998 . ( 4 ): 37 - 45 . http://www.cqvip.com/Main/Detail.aspx?id=3376756 http://www.cqvip.com/Main/Detail.aspx?id=3376756 .
T E GU , Y W LU , Z Z ZHONG , 等 . Low reflection, high transmission, wide viewing angle TFT-LCD for avionics applications . Advanced Display , 1998 . ( 4 ): 37 - 45 . http://www.cqvip.com/Main/Detail.aspx?id=3376756 http://www.cqvip.com/Main/Detail.aspx?id=3376756 .
陈 帅 , 陈 卓 , 李 乃升 , 等 . 对液晶显示窄边框专利技术的研究 . 中国新技术新产品 , 2018 . ( 9 ): 5 - 6 . http://d.old.wanfangdata.com.cn/Periodical/spyzl201714234 http://d.old.wanfangdata.com.cn/Periodical/spyzl201714234 .
S CHEN , Z CHEN , N S LI , 等 . Study on patent technology of borderless LCD . New Technology & New Products of China , 2018 . 9 5 - 6 . http://d.old.wanfangdata.com.cn/Periodical/spyzl201714234 http://d.old.wanfangdata.com.cn/Periodical/spyzl201714234 .
李 冰乔 . 浅谈窄边框液晶显示技术的现状与发展前景 . 电子测试 , 2019 . ( 8 ): 130 - 131, 88 . DOI: 10.3969/j.issn.1000-8519.2019.08.056 http://doi.org/10.3969/j.issn.1000-8519.2019.08.056 .
B Q LI . The present situation and development prospect of narrow frame liquid crystal display technology . Electronic Test , 2019 . ( 8 ): 130 - 131, 88 . DOI: 10.3969/j.issn.1000-8519.2019.08.056 http://doi.org/10.3969/j.issn.1000-8519.2019.08.056 .
H SCHMIDT , K HARALD , K JUDITH , 等 . Sputtered molybdenum-oxide for anti-reflection layers in displays: optical properties and thermal stability . SID Symposium Digest of Technical Papers , 2018 . 49 ( 1 ): 225 - 229 . DOI: 10.1002/sdtp.12531 http://doi.org/10.1002/sdtp.12531 .
X X ZHANG , Y Z SONG , X Q DING , 等 . Low reflectivity material development for border‐less LCD product . SID Symposium Digest of Technical Papers , 2019 . 50 ( 1 ): 1851 - 1853 . DOI: 10.1002/sdtp.13320 http://doi.org/10.1002/sdtp.13320 .
高 荣荣 , 刘 俊豪 , 周 保全 , 等 . 摩擦Mura机理和设计改善方法 . 液晶与显示 , 2019 . 34 ( 6 ): 570 - 575 . http://yjyxs.com/CN/abstract/abstract10479.shtml http://yjyxs.com/CN/abstract/abstract10479.shtml .
R R GAO , J H LIU , B Q ZHOU , 等 . Mechanism and design improvement on rubbing Mura . Chinese Journal of Liquid Crystals and Displays , 2019 . 34 ( 6 ): 570 - 575 . http://yjyxs.com/CN/abstract/abstract10479.shtml http://yjyxs.com/CN/abstract/abstract10479.shtml .
周 伟敏 , 周 平南 , 吴 廷斌 , 等 . NiTi薄膜残余应力测试方法的探讨 . 实验室研究与探索 , 2007 . 26 ( 1 ): 16 - 18 . DOI: 10.3969/j.issn.1006-7167.2007.01.005 http://doi.org/10.3969/j.issn.1006-7167.2007.01.005 .
W M ZHOU , P N ZHOU , T B WU . The residual stress study of NiTi Thin films by nanoindentation . Research and Exploration in Laboratory , 2007 . 26 ( 1 ): 16 - 18 . DOI: 10.3969/j.issn.1006-7167.2007.01.005 http://doi.org/10.3969/j.issn.1006-7167.2007.01.005 .
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