AMOLED亮点不良修复方法

朱世楠; 李楠

doi:10.3788/YJYXS20203503.0198

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AMOLED亮点不良修复方法

材料与器件 | 更新时间：2020-08-12

- AMOLED亮点不良修复方法
- Method of repairing AMOLED's bright pixel defect
- 液晶与显示 2020年35卷第3期页码：198-204
- 作者机构：
  
  成都京东方光电科技有限公司, 四川成都 611730
- 作者简介：
  
  [ "朱世楠(1994-), 男, 甘肃兰州人, 学士, 2015年于江苏大学获得学士学位, 主要从事AMOLED缺陷维修方面的研究。E-mail:zhushinan@boe.com.cn" ]
  [ "李楠(1989-), 男, 山东滨州人, 学士, 2012年于山东大学获得学士学位, 主要从事AMOLED缺陷检测与维修方面的研究。E-mail:nanli@boe.com.cn" ]
- 基金信息：
- DOI：10.3788/YJYXS20203503.0198
  中图分类号： TN383.1
- 收稿日期：2019-08-24，
  
  修回日期：2019-11-27，
  
  录用日期：2019-11-27，
  
  纸质出版日期：2020-03-05
- 稿件说明：
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朱世楠, 李楠. AMOLED亮点不良修复方法[J]. 液晶与显示, 2020,35(3):198-204.

Shi-nan ZHU, Nan LI. Method of repairing AMOLED's bright pixel defect[J]. Chinese journal of liquid crystals and displays, 2020, 35(3): 198-204.
朱世楠, 李楠. AMOLED亮点不良修复方法[J]. 液晶与显示, 2020,35(3):198-204. DOI： 10.3788/YJYXS20203503.0198.

Shi-nan ZHU, Nan LI. Method of repairing AMOLED's bright pixel defect[J]. Chinese journal of liquid crystals and displays, 2020, 35(3): 198-204. DOI： 10.3788/YJYXS20203503.0198.

摘要

为了提高有源矩阵有机发光二极管面板（AMOLED）亮点不良修复成功率，优化设备性能，本文研究一种AMOLED亮点修复方法，实现阴极隔离原理。由装置激光调形机构（Slit）的激光修复设备构造一束固定形状和频率的脉冲激光束。该激光束透过AMOLED面板封装层，照射目标亚像素上方阴极膜层，使目标亚像素发光层与面板整体阴极隔断，阴极电子无法迁移至目标亚像素发光层，目标亚像素由亮点变为暗点，达到亮点修复目的。提出并比较了矩形修复法与线修复法，结果表明：矩形修复方法成功率为33.5%，容易出现封装层损伤，信赖性风险高；线修复方法成功率为100%，无封装层损伤风险，信赖性风险低。将线修复方法导入量产后，亮点不良修复良率由96.9%提升至100%。

Abstract

In order to improve the success rate of repairing AMOLED's bright pixel defect and optimize the performance of the device

an AMOLED bright pixel defect repairing method is investigated to achieve the sub-pixel cathode isolation. Firstly

a pulsed laser beam with fixed shape and frequency is constructed by a laser repairing device with the laser shaping mechanism (Slit). Then

the laser beam passes through the AMOLED panel encapsulation layer to illuminate the cathode film layer above the target sub-pixel

so that the target sub-pixel luminescent layer is separated from the cathode of the panel. The cathode electrons cannot migrate to the target sub-pixel luminescent layer and the target sub-pixel changes from bright to dark. In this paper

the rectangular repair method and the line repair method are proposed and compared. The results show that the success rate of the rectangular repair method is 33.5%; the success rate of the line repair method is 100%. Compared with the rectangular repair method

the line repair method has a lower reliability risk. Therefore

the line repair method is better. In our study

the repair success rate increases from 96.9% to 100% when the line repair method is introduced into mass production.

关键词

Keywords

references

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