ADS液晶面板划痕Mura研究

李晓吉; 赵彦礼; 栗鹏; 李哲; 辛兰; 朴正淏; 廖燕平; 李承珉; 闵泰烨; 邵喜斌

doi:10.3788/YJYXS20203501.0031

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ADS液晶面板划痕Mura研究

材料与器件 | 更新时间：2020-07-05

- ADS液晶面板划痕Mura研究
- Strace Mura of ADS LCD
- 液晶与显示 2020年35卷第1期页码：31-40
- 作者机构：
  
  重庆京东方光电科技有限公司, 重庆 400700
- 作者简介：
  
  李晓吉(1989-), 女, 湖北襄阳人, 高级研究员, 2015年于河北工业大学获得硕士学位, 主要从事Cell设计方面的工作。E-mail:lixiaoji@boe.com.cn
- 基金信息：
  
  北京市科委首都科技领军人才培养工程应用技术研究与开发项目(No.201807)
- DOI：10.3788/YJYXS20203501.0031
  中图分类号： TN141.9
- 收稿日期：2019-06-06，
  
  修回日期：2019-10-29，
  
  录用日期：2019-10-29，
  
  纸质出版日期：2020-01-05
- 稿件说明：
移动端阅览
李晓吉, 赵彦礼, 栗鹏, 等. ADS液晶面板划痕Mura研究[J]. 液晶与显示, 2020,35(1):31-40.

Xiao-ji LI, Yan-li ZHAO, Peng LI, et al. Strace Mura of ADS LCD[J]. Chinese journal of liquid crystals and displays, 2020, 35(1): 31-40.
李晓吉, 赵彦礼, 栗鹏, 等. ADS液晶面板划痕Mura研究[J]. 液晶与显示, 2020,35(1):31-40. DOI： 10.3788/YJYXS20203501.0031.

Xiao-ji LI, Yan-li ZHAO, Peng LI, et al. Strace Mura of ADS LCD[J]. Chinese journal of liquid crystals and displays, 2020, 35(1): 31-40. DOI： 10.3788/YJYXS20203501.0031.

摘要

手指滑动ADS（Advanced Super Dimension Switch）液晶面板的L255画面时，由于按压导致的液晶分子形变和电场作用，滑动位置亮度会降低，表现为留下发暗的按压的痕迹。如果该痕迹在按压5 s后不能恢复，我们称之为划痕Mura（Trace Mura）。本文通过对比5种不同像素设计的液晶面板的滑动按压实验的结果，得到了像素电极设计、驱动电压对Trace Mura的影响；进一步模拟分析液晶分子状态，得到判断不同像素设计的Trace Mura风险的模拟方法。主要结论如下：首先，像素电极尾部设计对于Trace Mura改善方面，弧角设计优于切角设计，切角设计优于开口设计；像素电极间距（Space）越小，Trace Mura风险越小。其次，Trace Mura需要在高灰阶电压下按压划动液晶面板才能发生；而发生Trace Mura的液晶面板，可以通过降低液晶面板的电压灰阶来消除按压痕迹。最后，对比液晶分子状态模拟结果，确认在电极末端的液晶分子方位角会发生突变（即向相反方向偏转），模拟的突变角度在-15°以上，预测有Trace Mura风险。

Abstract

As for advanced super dimension switch (ADS) LCD

using finger to slide the surface of LCD lighting on L255 image

the luminance of sliding areas on LCD reduces owing to the liquid crystal molecules deformation and electrical field. Usually

the liquid crystal of sliding area recovers due to electrical field

and also the luminance of those sliding area recovers. While the dark area can not recover in 5 s

trace Mura occurs. In this paper

by validating the recovery time after finger sliding 5 kinds of panels with different slit end design and slit space values

the impact of pixel design on trace Mura is investigated. Comparing with simulated LC twist angle

a method for evaluating trace Mura of panel is found. The results are as flow:Firstly

for slit end design

panel with arc angle is the best for trace Mura prevention

and panel with open tilt is the worst

of course

panel with tangent tilt design appears middle risk for trace Mura. Simultaneously

narrower slit space design also appears faster recovery time and also is beneficial to trace Mura prevention. Secondly

reducing gray level of panel by setting a lower driving voltage is beneficial to trace Mura and also a good method for erasing trace Mura. Finally

the results of recovery time after sliding and simulated LC twist variations at slit end show that panel with larger than -15° LC twist variation has higher risk for trace Mura

which could be a method for evaluating trace Mura risk of ADS LCD.

关键词

Keywords

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