TN型液晶面板气泡不良分析研究与改善

王超; 徐习亮; 姚之晓; 朱东艳; 王健

doi:10.3788/YJYXS20193407.0634

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TN型液晶面板气泡不良分析研究与改善

材料与器件 | 更新时间：2020-07-05

- TN型液晶面板气泡不良分析研究与改善
- Analysis and improvement of bubble defect in TN mode liquid crystal panel
- 液晶与显示 2019年34卷第7期页码：634-639
- 作者机构：
  
  北京京东方显示技术有限公司, 北京 100176
- 作者简介：
  
  [ "王超(1987-), 男, 北京人, 学士, 高级工程师, 2010年于哈尔滨理工大学获得学士学位, 主要从事液晶面板工艺制程不良改进研究工作。E-mail:wangchao_dt1@boe.com.cn" ]
- 基金信息：
- DOI：10.3788/YJYXS20193407.0634
  中图分类号： TN141.9
- 收稿日期：2018-12-07，
  
  录用日期：2019-1-16，
  
  纸质出版日期：2019-07-05
- 稿件说明：
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王超, 徐习亮, 姚之晓, 等. TN型液晶面板气泡不良分析研究与改善[J]. 液晶与显示, 2019,34(7):634-639.

Chao WANG, Xi-liang XU, Zhi-xiao YAO, et al. Analysis and improvement of bubble defect in TN mode liquid crystal panel[J]. Chinese journal of liquid crystals and displays, 2019, 34(7): 634-639.
王超, 徐习亮, 姚之晓, 等. TN型液晶面板气泡不良分析研究与改善[J]. 液晶与显示, 2019,34(7):634-639. DOI： 10.3788/YJYXS20193407.0634.

Chao WANG, Xi-liang XU, Zhi-xiao YAO, et al. Analysis and improvement of bubble defect in TN mode liquid crystal panel[J]. Chinese journal of liquid crystals and displays, 2019, 34(7): 634-639. DOI： 10.3788/YJYXS20193407.0634.

摘要

液晶显示面板中气泡不良是一种出现频率低但影响较大的缺陷。本文研究了一种TN型液晶显示面板出现的气泡不良，分析原因为彩色滤光片（Color Filter，CF）中平坦化层（Over Coat，OC）材料由于在高温条件下长时间存放，导致OC内气体大量析出，通过氧化铟锡（Indium Tin Oxide，ITO）裂缝释放到面板中形成气泡。文章从不良产生机理、不良改善进行研究，论证了通过优化工艺参数、变更OC工艺及材料减少气体发生，变更ITO成膜温度来降低ITO裂缝的发生，从而从源头解决此不良，保证产品品质，提升客户满意。

Abstract

Bubble in LCD panel is a defect with low frequency but great influence. In this paper

a kind of Bubble defect in TN LCD panel was explored. The reason is that the OC (Over Coat) material in the CF (Color Filter) is stored at high temperature for a long time

which results in a large amount of gas precipitation in the OC. It is released into the panel through the cracks of ITO (Indium Tin Oxide) and finally forms bubbles. The generation principle of the bubbles and the improvement methods of bubbles were researched in this paper. It is proved that the gas generation can be reduced by optimizing process parameters and replacing OC materials

and the ITO cracks can be reduced by changing the temperature of ITO film formation

so as to solve the problem from the source. That guarantees product quality and improves customer satisfaction.

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