小尺寸TFT-LCD GOA显示屏不良横纹的研究

高英强; 陈华斌; 李兴亮; 刘洋; 宋勇志

doi:10.3788/YJYXS20193405.0501

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小尺寸TFT-LCD GOA显示屏不良横纹的研究

材料与器件 | 更新时间：2020-07-05

- 小尺寸TFT-LCD GOA显示屏不良横纹的研究
- Horizontal stripes defect of small size TFT-LCD GOA panel
- 液晶与显示 2019年34卷第5期页码：501-507
- 作者机构：
  
  北京京东方显示技术有限公司工艺开发部, 北京 100176
- 作者简介：
  
  [ "高英强(1985-), 男, 河北张家口人, 硕士, 2009年于长春理工大学获得硕士学位, 现为北京京东方显示技术有限公司高级研究员, 主要从事TFT-LCD产品不良分析及改善研究。E-mail:gaoyingqiang@boe.com.cn" ]
- 基金信息：
- DOI：10.3788/YJYXS20193405.0501
  中图分类号： TN27
- 收稿日期：2019-01-07，
  
  录用日期：2019-2-22，
  
  纸质出版日期：2019-05-05
- 稿件说明：
移动端阅览
高英强, 陈华斌, 李兴亮, 等. 小尺寸TFT-LCD GOA显示屏不良横纹的研究[J]. 液晶与显示, 2019,34(5):501-507.

Ying-qiang GAO, Hua-bin CHEN, Xing-liang LI, et al. Horizontal stripes defect of small size TFT-LCD GOA panel[J]. Chinese journal of liquid crystals and displays, 2019, 34(5): 501-507.
高英强, 陈华斌, 李兴亮, 等. 小尺寸TFT-LCD GOA显示屏不良横纹的研究[J]. 液晶与显示, 2019,34(5):501-507. DOI： 10.3788/YJYXS20193405.0501.

Ying-qiang GAO, Hua-bin CHEN, Xing-liang LI, et al. Horizontal stripes defect of small size TFT-LCD GOA panel[J]. Chinese journal of liquid crystals and displays, 2019, 34(5): 501-507. DOI： 10.3788/YJYXS20193405.0501.

摘要

随着GOA（Gate On Array）技术的不断发展，在小尺寸TFT-LCD窄边框显示屏上的应用也越来越频繁，但是由于GOA电路的复杂性和TFT器件自身的稳定性，以及外界温度、湿度的影响，显示屏还存在显示不稳定的问题。本文针对小尺寸TFT-LCD GOA显示屏在高温高湿环境下产生的异常显示横纹，进行了深入分析与改善研究。通过对GOA区域ITO过孔电阻测试、显微镜检查以及修复实验验证，找出了不良产生的直接原因为ITO发生腐蚀，过孔电阻增大，导致GOA驱动信号无法上下导通。接着进一步研究ITO腐蚀发生的条件、ITO腐蚀情况、驱动信号对应关系以及腐蚀成分，证明了ITO发生腐蚀原因为产品长期工作（200 h左右）在高温高湿环境下，由于水汽的不断渗入，使GOA区域ITO发生了电化学腐蚀效应。最后根据电化学腐蚀原理，通过采用隔水性强的封框胶、增加ITO膜厚以及降低ITO电位差等措施对工艺进行了改善，结果表明改善后的显示屏超过1 000 h，未发生ITO腐蚀。

Abstract

With the development of GOA technology

more and more GOA unit has been applied to small size TFT-LCD product. However

the display screen has an unstable display problem which is ascribed to the complicated GOA circuit configuration

characteristics and environmental factors such as temperature and humidity. In this paper

a horizontal stripes defect caused by GOA in display was deeply researched and the improving methods were given. This unusual phenomenon was related to corrosion of ITO in the GOA unit which induced ITO resistance to be too large and eventually the drive signal can't be output normally. Further research found that the electrochemical reaction would take place on ITO due to the continuous infiltration of water vapor through the GOA area in the high temperature and high humidity environment. Finally

according to the principle of electrochemical corrosion

the method of using water-repellent sealant was put forward

meanwhile the adjustment of increasing of the ITO's thickness and decreasing of the potential difference prevent corrosion of ITO in GOA

which made the product's working time increase from 200 h to 1 000 h.

关键词

Keywords

references

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