Rubbing Mura产生机理及改善研究

杨德波; 王云志; 陶雄; 李伟; 钟野; 罗春

doi:10.3788/YJYXS20183306.0469

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Rubbing Mura产生机理及改善研究

材料与器件 | 更新时间：2020-07-06

- Rubbing Mura产生机理及改善研究
- Principle and improvement research of rubbing Mura
- 液晶与显示 2018年33卷第6期页码：469-474
- 作者机构：
  
  重庆京东方光电科技有限公司, 重庆 400714
- 作者简介：
  
  [ "杨德波(1989-)，男，贵州遵义人，硕士，中级工程师，主要从事液晶显示面板的产品良率监管、不良解析及改善工作。E-mail:yangdebo@boe.com.cn" ]
- 基金信息：
- DOI：10.3788/YJYXS20183306.0469
  中图分类号： TN141.9
- 收稿日期：2018-01-08，
  
  录用日期：2018-2-27，
  
  纸质出版日期：2018-06
- 稿件说明：
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杨德波, 王云志, 陶雄, 等. Rubbing Mura产生机理及改善研究[J]. 液晶与显示, 2018,33(6):469-474.

De-bo YANG, Yun-zhi WANG, Xiong TAO, et al. Principle and improvement research of rubbing Mura[J]. Chinese journal of liquid crystals and displays, 2018, 33(6): 469-474.
杨德波, 王云志, 陶雄, 等. Rubbing Mura产生机理及改善研究[J]. 液晶与显示, 2018,33(6):469-474. DOI： 10.3788/YJYXS20183306.0469.

De-bo YANG, Yun-zhi WANG, Xiong TAO, et al. Principle and improvement research of rubbing Mura[J]. Chinese journal of liquid crystals and displays, 2018, 33(6): 469-474. DOI： 10.3788/YJYXS20183306.0469.

摘要

Rubbing Mura是以接触式摩擦工艺生产TFT_LCD产品时常见的顽固缺陷，尤其在HADS产品上不良发生率更高。本文对Rubbing Mura产生的原因及机理进行分析，发现该不良由TFT基板上的源极线（Source Data，SD）附近的Rubbing弱区漏光引起。研究了Rubbing强度（Nip值）、Rubbing布型号、Rubbing布寿命、黑矩阵（Black Matrix，BM）加宽和SD减薄对HADS产品的Rubbing Mura的影响，选择最优的工艺条件，Rubbing Mura的不良发生率由2.4%降至0%，改善效果明显。

Abstract

Rubbing Mura is a common defect in the production of TFT_LCD with contact rubbing process

especially in the high advanced super dimension switch (HADS) production. This paper analyzes the causes and mechanism of the Rubbing Mura

and finds that it is caused by the leakage of light from the weak zone of rubbing near the Source Data (SD). Further analysis has been done by comparing the rubbing strength (Nip value)

rubbing cloth model

rubbing cloth life

black matrix (BM) widening and SD thinning. The ratio of rubbing Mura has been reduced from 2.4% to 0% under the most optimal process condition

and the effect of the improvements is quite obvious.

关键词

Keywords

references

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