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成都京东方光电科技有限公司, 四川 成都 611731
[ "李兴华(1967-), 女, 辽宁鞍山人, 1990年毕业于哈尔滨科技大学(现更名为哈尔滨理工大学)应用物理专业, 高级工程师, 现任职于成都京东方光电科技有限公司, 主要从事液晶显示器方面的研究。E-mail:lixinghua@boe.com.cn" ]
[ "暴军萍(1984-), 女, 陕西宝鸡人, 硕士研究生, 2010年于北京化工大学获得硕士学位, 现任职于成都京东方光电科技有限公司, 主要从事液晶显示器方面的研究。E-mail:baojunping@boe.com.cn" ]
收稿日期:2017-11-06,
录用日期:2017-12-20,
纸质出版日期:2018-04-05
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李兴华, 暴军萍, 徐兵, 等. 液晶显示器模组黑态均匀性改善研究[J]. 液晶与显示, 2018,33(4):271-276.
Xing-hua LI, Jun-ping BAO, Bing XU, et al. Improvement research of TFT-LCD module black uniformity[J]. Chinese journal of liquid crystals and displays, 2018, 33(4): 271-276.
李兴华, 暴军萍, 徐兵, 等. 液晶显示器模组黑态均匀性改善研究[J]. 液晶与显示, 2018,33(4):271-276. DOI: 10.3788/YJYXS20183304.0271.
Xing-hua LI, Jun-ping BAO, Bing XU, et al. Improvement research of TFT-LCD module black uniformity[J]. Chinese journal of liquid crystals and displays, 2018, 33(4): 271-276. DOI: 10.3788/YJYXS20183304.0271.
随着显示行业发展,市场对液晶显示品质提出了更高的要求,特别是车载等领域,背光亮度几乎在10 000 cd/m
2
以上,此时显示装置的细微缺陷可能被凸显进而影响画面显示品质。黑态均匀性是液晶显示模组显示画质的重要指标,为提升液晶显示模组黑态均匀性,改善显示画质,特对可能造成黑态漏光的相应结构及设计进行研究。从液晶面板受外力方向,针对机构干涉及柔性电路板(FPC)应力两方面的影响因素设计实验,确定出利于提升黑态均匀性的设计方法或管控标准。实验结果表明,通过对背光及铁框平整度的管控及缓冲胶带优化可减少机构干涉应力,通过对FPC结构及外形设计优化可减少FPC弯折应力,通过玻璃厚度减薄及增大下偏光片尺寸可提升液晶面板抗变形能力,从而将模组黑态均匀性提升到80%以上。
With the development of display industry
market has the higher requirement of products quality. Especially for vehicle display field
the brightness of backlight is almost more than 10000 cd/m
2
which may enlarge small defects in display screen to impact display quality. As black uniformity is a crucial characteristic of image quality
the investigation of the structure and designing of liquid crystal display module which can generate black light leakage have been in progress for optimizing uniformity of black state to achieve best display quality. Those experiments were designed on the basis of external forces for Panel
mechanism interference and FPC stress to catch optimum methods or control standards for best black uniformity. The experimental results show
the module black uniformity has been increased more than 80% by decreasing interference stress
which was implemented by controlling the flatness of backlight and metal frame
optimizing the design of buffer tape
decreasing bend stress by optimizing structure and shape design of FPC
improving panel's stress resistance ability by reducing panel thickness and increasing dimension of Polarizer.
张鹏, 马婷婷, 杨叶花, 等.液晶显示器Mura缺陷及测量方法浅析[J].电子测试, 2017(6):50-52.
ZHANG P, MA T T, YANG Y H, et al. Mura defect and measurement method of liquid crystal display[J]. Electronic Test , 2017(6):50-52. (in Chinese)
郭程杰.液晶显示模组漏光不良现象的解决策略研究[J].商品与质量, 2017(14):14.
GUO C J. Study on resolutions of LCM light leakage defect[J]. The Merchandise and Quality , 2017(14):14. (in Chinese)
王志龙, 郑英花, 马亮, 等.L0周边Mura分析及其改善研究[J].液晶与显示, 2014, 29(5):668-673.
WANG Z L, ZHENG Y H, MA L, et al . Research and improvement of L0 side Mura[J]. Chinese Journal of Liquid Crystals and Displays , 2014, 29(5):668-673. (in Chinese)
胡伟, 穆洪杨, 谈宝权, 等.散射光弹性技术在化学钢化玻璃表面应力测量中的应用[J].玻璃与搪瓷, 2017, 45(5):29-33.
HU W, MU H Y, TAN B Q, et al . Measurement of surface stress of chemically strengthened glass by scattered light photoelasticity[J]. Glass & Enamel , 2017, 45(5):29-33. (in Chinese)
廖红波, 王婷, 何琛娟, 等.液晶盒双折射效应的测量与应用[J].大学物理, 2016, 35(8):44-47.
LIAO H B, WANG T, HE C J, et al . The measurement and application of the birefringence effect in liquid crystal cell[J]. College Physics , 2016, 35(8):44-47. (in Chinese)
王永超, 张志东, 周璇.向列相液晶弹性各向异性诱导液晶盒产生漏光的研究[J].液晶与显示, 2015, 30(6):949-959.
WANG Y C, ZHANG Z D, ZHOU X. Study of light leakage induced by the elastic anisotropy of the nematic liquid crystal[J]. Chinese Journal of Liquid Crystals and Displays , 2015, 30(6):949-959. (in Chinese)
YANG Y F, KIMAN K, QIN G K, et al . Simulation and experimental study on light leakage in ADS mode LCDs[J]. SID Symposium Digest of Technical Papers , 2014, 45(1):1251-1254.
WANG Y C, ZHANG Z D, ZHOU X. Light leakage induced by spontaneous distortion of the nematic director in bulk defect structures[J]. Journal of Display Technology , 2016, 12(4):402-411.
YOU J, JIA Q, YANG Y F, et al . Improvement of dark state light leakage in ADS mode LCDs[J]. SID Symposium Digest of Technical Papers , 2015, 46(1):1544-1547.
CHANG C C, LEU J, LIN M H, et al . Effects of localized warpage and stress on chip-on-glass packaging induced light leakage phenomenon in 13-inch TFT-LCD[J]. SID Symposium Digest of Technical Papers , 2009, 40(1):838-841.
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