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鄂尔多斯市源盛光电有限责任公司, 内蒙古 鄂尔多斯 017000
[ "见帅敏(1992-), 男, 陕西宝鸡人, 本科学位, 主要从事TFT-LCD工艺研究。E-mail:jianshuaimin@boe.com.cn" ]
收稿日期:2016-12-20,
录用日期:2017-2-28,
纸质出版日期:2017-06-05
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Shuai-min JIAN, Yang XIE, Gao-fei XIA, et al. Analysis and improvement of TFT-LCD edge light-leaking mechanism[J]. Chinese journal of liquid crystals and displays, 2017, 32(6): 455-460.
见帅敏, 解洋, 夏高飞, 等. TFT-LCD边角漏光不良机理分析及改善研究[J]. 液晶与显示, 2017,32(6):455-460. DOI: 10.3788/YJYXS20173206.0455.
Shuai-min JIAN, Yang XIE, Gao-fei XIA, et al. Analysis and improvement of TFT-LCD edge light-leaking mechanism[J]. Chinese journal of liquid crystals and displays, 2017, 32(6): 455-460. DOI: 10.3788/YJYXS20173206.0455.
目前,薄膜晶体管型液晶显示器(Thin-Film Technology Liquid Crystal Display,TFT-LCD)已成为显示领域的主流产品,而液晶面板是TFT-LCD的一个重要组成部分。LCD边缘漏光会导致画面失真,影响可视效果,造成画面显示品质下降、良率降低,因此改善边缘漏光成为急待解决的问题。本文研究了液晶与PI膜层取向异常对边角漏光的影响、LC Pattern设计对边角漏光的影响、Si-Ball型号对边角漏光的影响等,结果证明LC Pattern设计对边角漏光具有较好的改善效果,Pattern拉伸可改善边角漏光但更易造成液晶穿刺现象,小滴优化不仅能改善边角漏光而且也能防止液晶穿刺。另外小型Si-Ball对边角漏光改善效果最优,同时从信赖性验证等方面可以排除较小Si-Ball,限定出Si-Ball选择范围。
At present
Thin Film Transistor Liquid Crystal Display (TFT-LCD
Thin-Film Technology Liquid Crystal Display) has become the mainstream in the field of Display products
and LCD panel is an important component of TFT-LCD. LCD edge light-leaking can cause image distortion
affect the visual effects
resulting in lower quality display screen and yield
thus improving the edge light-leaking become an urgent problem to be solved. This paper studies the influence of the abnormal orientation of liquid crystal and PI film on the edge light-leaking
the influence of LC Pattern design on edge light-leaking
and the influence of the Si-Ball edge light-leaking. The result illustrates the LC Pattern design for edge light-leaking improvement has a good effect
the pattern drawing is more likely to cause LCD puncture phenomenon
the droplet optimization can be relatively better. The effect of small Si-Ball on the edge light-leaking is the best. Meanwhile
we eliminated the smaller silicon ball by reliability verification and found the range of Si-Ball. Excluding small Si-Ball limits the choice of Si-Ball from the reliability of validation and others.
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