傅立叶1/4波片法检测液晶光学相控阵移相量的精度分析

汪相如; 贺晓娴; 方琳; 黄子强

doi:10.3788/YJYXS20173201.0007

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傅立叶1/4波片法检测液晶光学相控阵移相量的精度分析

材料与器件 | 更新时间：2020-07-07

- 傅立叶1/4波片法检测液晶光学相控阵移相量的精度分析
- Precision analysis on the phase delay measurement method of Fourier quarter-wave-plate on liquid crystal optical phased array
- 液晶与显示 2017年32卷第1期页码：7-12
- 作者机构：
  
  1.电子科技大学光电信息学院, 四川成都 611731
  2.电子科技大学电子科学技术研究院, 四川成都 610054
- 作者简介：
  
  汪相如(1983-),男,安徽黄山人,博士,副教授,研究方向为液晶光电子学。E-mail:xiangruwang@uestc.edu.cn
  [ "贺晓娴(1996-),女,山西临汾人,硕士,研究方向为液晶光电子学。E-mail:hexiaoxian2@163.com" ]
- 基金信息：
  
  国家自然科学基金(No.61405029；No.91438108);Supported by National Natural Science Foundation of China(No.61405029;No.91438108)
- DOI：10.3788/YJYXS20173201.0007
  中图分类号： O734
- 收稿日期：2016-07-05，
  
  录用日期：2016-8-25，
  
  纸质出版日期：2017-01
- 稿件说明：
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汪相如, 贺晓娴, 方琳, 等. 傅立叶1/4波片法检测液晶光学相控阵移相量的精度分析[J]. 液晶与显示, 2017,32(1):7-12.

Xiang-ru WANG, Xiao-xian HE, Lin FANG, et al. Precision analysis on the phase delay measurement method of Fourier quarter-wave-plate on liquid crystal optical phased array[J]. Chinese journal of liquid crystals and displays, 2017, 32(1): 7-12.
汪相如, 贺晓娴, 方琳, 等. 傅立叶1/4波片法检测液晶光学相控阵移相量的精度分析[J]. 液晶与显示, 2017,32(1):7-12. DOI： 10.3788/YJYXS20173201.0007.

Xiang-ru WANG, Xiao-xian HE, Lin FANG, et al. Precision analysis on the phase delay measurement method of Fourier quarter-wave-plate on liquid crystal optical phased array[J]. Chinese journal of liquid crystals and displays, 2017, 32(1): 7-12. DOI： 10.3788/YJYXS20173201.0007.

摘要

为了能够更好地实现对液晶光学相控阵的移相分布特性进行高精度的测量，本文针对傅里叶四分之一波片法的测试精度进行理论仿真和试验验证。仿真结果表明，该方法测试误差小于0.08°，采用标准二分之一波片对其进行验证，实验结果表明重复精度小于0.3°。因此，针对液晶光学相控阵波控数据0.5°移相控制精度要求，傅里叶四分之一波片法的测试精度和重复精度能够满足移相测量精度要求。

Abstract

With the purpose of highly precise measuring the phase delay distribution of liquid crystal optical phased array

the accuracy and precision of the measuring method of Fourier Quarter-Plate are both analyzed theoretically and evaluated experimentally. Numerical simulations indicate that the error of this method is smaller than 0.3° when we assumed a couple of ordinary parameters on the system. A practical experiment on a standard half wave plate is also accomplished showing that the accuracy is smaller than 0.3° and the repeat precision is also smaller than 0.3°. Simulations and experiments show a good agreement with each other so that a demonstration Fourier Quarter-Plate method can meet the requirement on phase delay measurement better than 0.5° on liquid crystal optical phased array.

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references

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