Xiao-wei LIU, ming TIAN, Liang-liang LI, et al. Analysis and improvement of a larger size TFT-LCD block mura[J]. Chinese journal of liquid crystals and displays, 2016, 31(11): 1033-1037.
Xiao-wei LIU, ming TIAN, Liang-liang LI, et al. Analysis and improvement of a larger size TFT-LCD block mura[J]. Chinese journal of liquid crystals and displays, 2016, 31(11): 1033-1037. DOI: 10.3788/YJYXS20163111.1033.
A new unknown block mura of large size TFT-LCD has been studied in this paper. The mura was observed by SEM
Four-probe tester and Spectrophotometer. It is caused by the periodic changing of TFT metal line thickness. The periodic changing of metal line thickness led to the changing of LCD cell gap
influencing display quality of TFT-LCD. The periodic changing metal line thickness is caused by adopting the structure of a kind of flat target magnetron sputter equipment
which is used in large size TFT-LCD production line widely. The thickness uniformity of metal line was improved by modifying the equipment structure. The mura disappeared after the thickness uniformity is improved.
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references
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