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1. 深圳市华星光电技术有限公司,广东 深圳,518132
2. 西安交通大学 电子与信息工程学院 电子物理与器件教育部重点实验室,陕西 西安,710049
收稿日期:2016-01-14,
修回日期:2016-01-31,
纸质出版日期:2016-05-05
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屠震涛, 樊瑞, 张小宁等. 灰度与亮度拟合对LCD面板Mura改善的影响[J]. 液晶与显示, 2016,31(5): 442-448
TU Zhen-tao, FAN Rui, ZHANG Xiao-ning etc. Influence of fitting curve between grayscale and brightness on Mura improvement of LCD panel[J]. , 2016,31(5): 442-448
屠震涛, 樊瑞, 张小宁等. 灰度与亮度拟合对LCD面板Mura改善的影响[J]. 液晶与显示, 2016,31(5): 442-448 DOI: 10.3788/YJYXS20163105.0442.
TU Zhen-tao, FAN Rui, ZHANG Xiao-ning etc. Influence of fitting curve between grayscale and brightness on Mura improvement of LCD panel[J]. , 2016,31(5): 442-448 DOI: 10.3788/YJYXS20163105.0442.
选择有限的采样灰度级准确拟合出整个灰度区间的亮度和灰度关系
是影响LCD面板Mura改善效果、实时性和成本的关键因素。通过迭代方法优化采样灰度级
并采用分段伽马拟合方法研究了采样灰度级对Mura改善的影响。针对1 9201 080的55 inTFT-LCD模组
6个采样灰度级的优化使拟合亮度曲线与实际亮度曲线的相对误差之和在0~255灰度级从5.64降到3.68
4个采样灰度级的优化使相对误差之和从29.27降到8.98。通过对6个和4个优化采样灰度级的实验结果比较和分析
结果表明
4个优化采样灰度级可以在Mura改善效果、实时性及成本三者之间达到较好的平衡。
It is a key issue to select limited sampled grayscales to fit the curve accurately between the luminance and whole grayscales that affect the Mura improvement
real time
and cost of LCD panels. The limited sampled grayscales were optimized by the iterative method
and the influence of the optimized grayscales on the Mura improvement was investigated by the segmented gamma fitted method. To a 55 in TFT-LCD module with resolution of 1 9201 080
the relative error in 0~255 grayscale between fitting and actual brightness curve decreases from 5.64 to 3.68 with optimization of six sampled grayscales and from 29.27 to 8.98 with optimization of four sampled grayscales. The experimental results of six and four optimized sampled grayscales on the mura improvement indicates that the mura improvement effect
real-time
and cost of LCD panels by using four optimized sampled grayscales are better.
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李坤,李辉,刘云杰,等. LCD Mura缺陷的B样条曲面拟合背景抑制[J]. 光电工程, 2014,41(2):33-39. LI K, LI H, LIU Y J,et al. Background suppression of LCD mura defect using B-spline surface fitting[J]. Opto-Electronic Engineering, 2014, 41(2):33-39. (in Chinese)
王新新,徐江伟,邹伟金,等. TFT-LCD缺陷检测系统的研究[J]. 电子测量与仪器学报, 2014,28(3):278-284. WANG X X, XU J W, ZOU W J, et al. Research on detection system for TFT-LCD defects[J]. Journal of Electronic Measurement and Instrumentation, 2014, 28(3):278-284. (in Chinese)
LEE Y H, TANG K H. How human perceptions of Mura affect LCD market values[J]. Displays, 2012, 33(1):46-53.
张昱,张健. 模糊专家系统在TFT-LCD缺陷检测中的应用[J]. 光电子激光, 2006,17(6):719-723. ZHANG Y, ZHANG J.Application of fuzzy expert system in defect inspection of TFT-LCD[J]. Journal of OptoelectronicsLaser, 2006, 17(6):719-723. (in Chinese)
京东方科技集团股份有限公司. TFT-LCD像素电极层结构、制备方法及其掩膜版:中国,201110095453[P].2011-08-31. BOE Technology Group Limited by Share Ltd. TFT-LCD pixel electrode layer structure, preparation method and mask:CN, 201110095453[P]. 2011-08-31. (in Chinese)
LEE H, WHANG K W. A quantitative measurement of LCD and PDP TVs for human visual preference and fatigue[J]. Displays, 2012, 33(1):1-6.
程石,王涛,张敏,等. TFT-LCD中隔垫物密度与Push Mura和低温气泡的关系[J]. 液晶与显示, 2011,26(5):604-607. CHENG S, WANG T, ZHANG M,et al. Relationship of spacer density with Push Mura and cold bubble in TFT-LCD[J]. Chinese Journal of Liquid Crystals and Displays, 2011, 26(5):604-607. (in Chinese)
CHEN H C, FANG L T, LEE L, et al. LOG-filter-based inspection of cluster Mura and vertical-band Mura on liquid crystal displays[C]. Proceedings of the SPIE, Machine Vision Applications in Industrial Inspection XⅢ, 257, San Jose, CA:SPIE, 2005, 5679:257-265.
CHEN S L, CHANG J H. TFT-LCD Mura defects automatic inspection system using linear regression diagnostic model[J].Proceedings of the Institution of Mechanical Engineers, Part B:Journal of Engineering Manufacture, 2008, 222(11):1489-1501.
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