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河北工业大学理学院, 天津 300401
[ "王永超(1987-),男,河北邯郸人,硕士研究生,主要从事液晶物理等方面的研究。E-mail:929413721@qq.com" ]
[ "张志东(1961-),男,山东蓬莱人,教授,博士生导师,主要从事液晶物理等方面的研究。E-mail:zhidong_zhang1961@163.com" ]
[ "周璇(1985-),女,河北石家庄人,博士,讲师,主要从事液晶物理等方面的研究。E-mail:zhouxuan198536@163.com" ]
收稿日期:2015-04-23,
修回日期:2015-07-15,
纸质出版日期:2015-12-05
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王永超, 张志东, 周璇. 向列相液晶弹性各向异性诱导液晶盒产生漏光的研究[J]. 液晶与显示, 2015,30(6): 949-959
WANG Yong-chao, ZHANG Zhi-dong, ZHOU Xuan. Study of light leakage induced by the elastic anisotropy of the nematic liquid crystal[J]. , 2015,30(6): 949-959
王永超, 张志东, 周璇. 向列相液晶弹性各向异性诱导液晶盒产生漏光的研究[J]. 液晶与显示, 2015,30(6): 949-959 DOI: 10.3788/YJYXS20153006.0949.
WANG Yong-chao, ZHANG Zhi-dong, ZHOU Xuan. Study of light leakage induced by the elastic anisotropy of the nematic liquid crystal[J]. , 2015,30(6): 949-959 DOI: 10.3788/YJYXS20153006.0949.
为了阐述具有体缺陷结构的向列相液晶盒在暗态出现漏光的原因
以及边界锚定条件对漏光的影响
首先
建立了3个向列相液晶盒模型
它们具有不同的初始指向矢排布。接着
基于Landau-de Gennes理论
通过对指向矢场的缺陷动力学计算
得到液晶盒截面内平衡态的指向矢分布。最后
使用琼斯矩阵法将该截面内的指向矢分布以透过率的形式表示出来。模拟结果显示
在无外场条件下
当向列相液晶的弹性常数满足
L
2
/
L
1
1(
K
22
/
K
11
2/3)时
具有体缺陷结构的液晶盒展现出了自发的扭曲结构
导致了漏光的出现。且漏光强度随着缺陷结构和边界条件的不同而不同。本文模型很好地解释了体缺陷造成液晶盒在暗态出现漏光的原因
且模拟结果与工业生产过程中观察到的现象是一致的。
In the paper
we show the reasons for light leakage in the nematic liquid crystal (NLC) cells with bulk defect structure in the dark state and the influence of the anchoring conditions on it. Firstly
we give three models of NLC cells with different director distribution at the initial state. Secondly
based on the Landau-de Gennes theory
we calculate the defect dynamics of the director field and get the director distribution in the cross-section of the cells at equilibrium state. Finally
we express the director distribution in the form of light transmittance with Jones Calculus. Without applied field
the simulation results indicate that the cells with bulk defect have spontaneous twist structure under the condition of
L
2
/
L
1
1(
K
22
/
K
11
2/3)
which leads to light leakage of the cells. The intensity of light leakage varies with defect structures and anchoring conditions at the boundaries. Our models can explain the light leakage in the NLC cells induced by the bulk defect in the dark state
and the results show a good agreement with the phenomena found in the process of industry manufacture.
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