液晶组分以及V-T曲线漂移与线残像关系研究

李锐; 丰景义; 温刚; 乔云霞; 徐凯; 崔青

doi:10.3788/YJYXS20153004.0581

您当前的位置：

首页 >

文章列表页 >

液晶组分以及V-T曲线漂移与线残像关系研究

材料物理和化学 | 更新时间：2020-08-12

- 液晶组分以及V-T曲线漂移与线残像关系研究
- LC mixture composition and V-T drift related to line image sticking
- 液晶与显示 2015年30卷第4期页码：581-589
- 作者机构：
  
  石家庄诚志永华显示材料有限公司,河北石家庄,050091
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20153004.0581
  中图分类号： TN27;TN104.3
- 收稿日期：2014-10-22，
  
  修回日期：2015-01-07，
  
  纸质出版日期：2015-08-05
- 稿件说明：
移动端阅览
李锐, 丰景义, 温刚, 乔云霞, 徐凯, 崔青. 液晶组分以及V-T曲线漂移与线残像关系研究[J]. 液晶与显示, 2015,30(4): 581-589

LI Rui, FENG Jing-yi, WEN Gang, QIAO Yun-xia, XU Kai, CUI Qing. LC mixture composition and V-T drift related to line image sticking[J]. , 2015,30(4): 581-589
李锐, 丰景义, 温刚, 乔云霞, 徐凯, 崔青. 液晶组分以及V-T曲线漂移与线残像关系研究[J]. 液晶与显示, 2015,30(4): 581-589 DOI： 10.3788/YJYXS20153004.0581.

LI Rui, FENG Jing-yi, WEN Gang, QIAO Yun-xia, XU Kai, CUI Qing. LC mixture composition and V-T drift related to line image sticking[J]. , 2015,30(4): 581-589 DOI： 10.3788/YJYXS20153004.0581.

摘要

线残像是液晶显示不良的一种表现

对在Cell中短时间内判断液晶线残像的强弱进行了研究。本文使用了4种介电各向异性相同的液晶

对这4款混晶所制成的TFT-LCD屏进行了线残像水平测定

系统分析了混晶的组分与线残像的关系

并使用了一种通过加直流电压测试

V-T

曲线的漂移来判断液晶残像强弱的方法

对4款混晶做了

V-T

曲线漂移实验。组分分析表明

介电各向异性相同的情况下

液晶中-CF

O-类单体和-COO-类单体的使用会导致线残像的发生。

V-T

漂移实验结果表明

变化率小于5%时

液晶显示线残像轻微

变化率大于10%时

线残像严重。这种方法可以在Cell中进行

并且使测试时间明显缩短

这对提高液晶的研发效率具有指导意义。

Abstract

Image sticking is a display defect of TFT-LCD.The problem is to judge the level of line image sticking in cell in a short time.Generally

image sticking is related to dielectric anisotropy of liquid crystal.In this paper

4 LC mixtures which have the same dielectric anisotropy are used for image sticking research.The line image sticking level of TFT-LCD using the 4 kinds of LC mixtures are evaluated.The relationship between LC mixture composition and line image sticking is analyzed. The use of -CF

O- and -COO- type of single can lead to line image sticking.In this paper

a method of measuring the strength of image sticking by testing the drift of

V-T

curve in DC voltage is explored.The principle of this method is analyzed.The experimental shows that when the rate of changeis less than 5%

line image sticking is slight

when larger than 10%

line image sticking is serious.This method can be carried out in Cell

and the test time was significantly reduced

which has the significance for improving the efficiency of the liquid crystal developing.

关键词

Keywords

references

史子谦,丰景义,贵丽红,等. 高折射率液晶化合物与液晶组合物 [J]. 液晶与显示, 2013, 28(3): 310-314. Shi Z Q,Feng J Y,Gui L H,et al. High birefringence LC compounds and LC mixtures [J].Chinese Journal of Liquid Crystals and Displays, 2008, 28(3): 310-314.(in Chinese)[2] Huang P W.Liang B J.Study on image sticking phenomenon in STN LCD [D].DMC, 2003:667.[3] 王丹,梁晓,唐洪. TFT-LCD液晶材料对显示残像的影响 [J]. 液晶与显示, 2008, 23(4): 412-414. Wang D,Liang X,Tang H.The influence of TFT-LCD materials to Image sticking [J].Chinese Journal of Liquid Crystals and Displays, 2008, 23(4): 412-414.(in Chinese)[4] 马群刚.TFT-LCD原理与设计 [M].北京:电子工业出版社,2011. Ma Q G.TFT-LCD Theory and Design [M].Beijing:Electronic Machinery Press, 2011.(in Chinese)[5] 焦峰,王海宏. TFT-LCD残像原理与分析(基础篇) [J]. 现代显示, 2012(4): 54-59. Jiao F, Wang H H.The theory and analysis of TFT-LCD image sticking(Basis) [J].Advanced Display, 2012(4): 54-59.(in Chinese)[6] Sasaki T, Tsumura M, Nagase Y, et al. An analysis of image-sticking effect by transmittance drift measurement in liquid crystal cells [J].Electronics and Communications in Japan, 1995, 78(2): 79-85.[7] Park H J, Luc L, Lin S H, et al. P-1: Analysis of IPS Mura, image-sticking and flicker caused by internal DC effects [J].SID Symposium Digest of Technical Papers,2003, 34(1): 204-207.[8] Lee D J, Kim I H, Soh H S, et al. P-33: A measurement and analysis method of image sticking in LCD [J].SID Symposium Digest of Technical Papers,2002, 33(1): 324-327.[9] Park S C, Lim K H, Choi S H, et al. 20.3: Quantitative analysis of image sticking in LCDs [J].SID Symposium Digest of Technical Papers,2007, 38(1): 1042-1045.[10] Park Y E, Kim S K, Lee E S, et al. A study on reducing image-sticking artifacts in wide-screen TFT-LCD monitors [J].Journal of the Society for Information Display,2007, 15(11): 969-973.[11] Kamoto R.Analysis of image sticking on a real MVA Cell [J].Journal of the Society for Information Display,2008, 16(3): 451-456.[12] Kamoto R.P-124: Analysis of image sticking on real cell Analysis of the cause material of boundary image sticking [J].SID Symposium Digest of Technical Papers,2007, 38(1): 669-672.[13] Huang K T, Chao A, Yu C H.P-123: Image sticking analysis of different q-time lc cell by machine vision [J].SID Symposium Digest of Technical Papers,2007, 38(1): 665-668.[14] Hong H K, Ahn J Y, Jung H Y, et al. Moving-image-sticking phenomenon induced by an outside force in liquid-crystal displays [J].Journal of the Society for Information Display,2008, 16(8): 883-888.[15] Maekawa Y, Mori N, Kohno M.P-70: Image sticking measuring method by usage model [J].SID Symposium Digest of Technical Papers,2010, 41(1): 1512-1515.

浏览量

103

下载量

CSCD

文章被引用时，请邮件提醒。

提交

工具集

关联资源

TFT-LCD中电容对公共电压的影响

TFT-LCD中驱动信号对线残像的改善研究

TFT-LCD表面Mura缺陷的AOI检测研究进展

TFT-LCD用黑色光刻胶材料对曝光过程Mark读取的影响