TDICCD相机成像系统片式电阻失效分析

曲利新

doi:10.3788/YJYXS20142906.0906

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TDICCD相机成像系统片式电阻失效分析

器件物理及器件制备技术 | 更新时间：2020-08-12

- TDICCD相机成像系统片式电阻失效分析
- Failure analysis for chip resistor of TDICCD camera imaging system
- 液晶与显示 2014年29卷第6期页码：906-910
- 作者机构：
  
  中国科学院长春光学精密机械与物理研究所, 吉林长春 130033
- 作者简介：
  
  [ "曲利新（1966-），男，吉林人，研究员，主要研究方向为空间遥感相机。E-mail：qulx2007@163.com" ]
- 基金信息：
  
  国家自然科学基金（No.61036015）()
- DOI：10.3788/YJYXS20142906.0906
  中图分类号： TV19
- 收稿日期：2014-01-06，
  
  修回日期：2014-02-11，
  
  网络出版日期：2014-05-02，
  
  纸质出版日期：2014-12-05
- 稿件说明：
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曲利新. TDICCD相机成像系统片式电阻失效分析[J]. 液晶与显示, 2014,29(6): 906-910

QU Li-xin. Failure analysis for chip resistor of TDICCD camera imaging system[J]. , 2014,29(6): 906-910
曲利新. TDICCD相机成像系统片式电阻失效分析[J]. 液晶与显示, 2014,29(6): 906-910 DOI： 10.3788/YJYXS20142906.0906.

QU Li-xin. Failure analysis for chip resistor of TDICCD camera imaging system[J]. , 2014,29(6): 906-910 DOI： 10.3788/YJYXS20142906.0906.

摘要

为了判断TDICCD相机成像系统在温度循环试验中出现的故障原因，通过故障模式影响及危害性分析，建立了故障树。经排查分析和测试，判断故障部位是地址线表面贴装片式电阻。元器件可靠性中心通过电测和DPA，对该片式电阻进行了失效分析。检查结果表明，该片式电阻是由使用过程中的异常外力造成片式电阻器端电极局部脱落，并排除了该器件存在批次性缺陷的可能。异常外力的来源是电装操作人员在返修过程中焊接时间过长，热应力导致片式电阻器端电极局部脱落。改进措施为严格控制片式电阻焊接时间小于2 s。该故障定位准确，机理清楚，经试验验证，措施有效。

Abstract

In order to determine the fault reason of TDI CCD camera imaging system during temperature cycle experimentation

the failure tree is established through fault mode effect and harm analysis. Through detail checking and testing

the fault is located in the region where the surface mount resistor is mounted for address. The failure analysis of this chip resistor is done in the components reliability center through electric test and DPA. Checking results show that exceptional stress causes terminal break off of the resistor during operation. The lot default probability is also precluded. The exceptional stress is derived from long time soldering during the repair by the soldering people. This thermal stress causes the terminal break off of the resistor. The fault is located correctly. The improved measure is limiting the soldering time of chip resistors strictly no more than 2 s. The principle is also clear. The solution is effective after experimental validation.

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references

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