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北京京东方显示技术有限公司CELL PI部, 北京 100176
收稿日期:2014-01-01,
修回日期:2014-02-24,
纸质出版日期:2014-10-05
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王志龙, 郑英花, 马亮, 朱载荣, 孙鹏, 廖燕平. L0周边Mura分析及其改善研究[J]. 液晶与显示, 2014,29(5): 668-673
WANG Zhi-long, ZHENG Ying-hua, MA Liang, ZHU Zai-rong, SUN Peng, LIAO Yan-ping. Research and improvement of L 0 side Mura[J]. , 2014,29(5): 668-673
王志龙, 郑英花, 马亮, 朱载荣, 孙鹏, 廖燕平. L0周边Mura分析及其改善研究[J]. 液晶与显示, 2014,29(5): 668-673 DOI: 10.3788/YJYXS20142905.0668.
WANG Zhi-long, ZHENG Ying-hua, MA Liang, ZHU Zai-rong, SUN Peng, LIAO Yan-ping. Research and improvement of L 0 side Mura[J]. , 2014,29(5): 668-673 DOI: 10.3788/YJYXS20142905.0668.
L0周边Mura 是TFT-LCD的一种常见缺陷。本文对L0周边Mura发生原因进行分析,发现真空对盒工艺进行过程中玻璃基板表面受力不均使力学合成力较少的局部位置发生形变并引起液晶屏周边区域盒厚波动,产生不良。采用辅助封框胶开环方式,主封框胶内外两侧压差趋于平衡,L0周边Mura发生率大幅降低;而通过优化辅助封框胶工艺有效地解决了周边区域力学失衡难题,不良发生率降至0.3%,改善效果明显。此外,周边优化设计方案有助于新产品开发阶段避免该不良发生。
L0 Side Mura is the common defect of TFT-LCD. After analyzing the stress status of panel surrounding area
the root cause can be revealed. It can be found that the stress distribution of glass substrate is quite uneven during cell assembly process
and this induced the deformation under the influence of smaller resultant force in local area
then caused cell gap fluctuating around the panel and generate defect. To solve this issue
dummy seal open mode was applied to make differential pressure between inside and outside the main seal on both sides into balance
which reduced the failure rate slightly lower. Nevertheless
the incidence of L0 Side Mura can be effectively reduced to 0.3% by improving dummy seal process to solve the problem of mechanics imbalance in certain. Furthermore
it will be avoided in development stage of new product through optimizing design scheme around Panel.
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