Nowadays

much attention had been paid to the investigation of Touch Mura

which affects the performance of products seriously. It has been observed frequently during the manufacturing process of TFT-LCD products. In this paper

several important impact factors to the Touch Mura were systematically studied

including the liquid-crystal quantity

the designing of sub PS

the designing of height difference between main PS and sub PS

and the total pitch (one of the process parameters). The experiment results demonstrated that the increment of liquid-crystal quantity can compensate the touch shift; thereby the decrease of the defect rates in Touch Mura will be lead to a certain extent. The "Z" design of sub PS can ease the Touch Mura effectively due to the blocking effect. Besides

it was also found that the more height difference between main PS and sub PS

the smaller Touch Mura margin is; meanwhile

if it set the parameter of total pitch close to the design values

the Touch Mura will occur in a very little chance. In conclusion

in order to reduce the risk of Touch Mura

it can obey the following ways in the new frame

including the proper using liquid-crystal quantity

the optimum designing of sub-PS

and the metering the height difference between the main and sub PS. In addition

the controlling of total pitch is also of great importance in manufacturing process.