An optoelectronic device current-voltage (

I-V

) testing platform was established based on the software LabVIEW

including a PCI-GPIB card from American National Instrument (NI) Corporation as well as 6517 Electrometer/High Resistance Meter from Keithley Corporation. Using the LabVIEW program to control Keithley6517

the system has the function of collecting

displaying

storing and analyzing the voltage and current data through the GPIB card. It can also draw the

I-V

characteristic curve according to the measured data and figure out the relevant parameters of different devices.In this paper

taking solar cell as an example

it figures out the open voltage (

V

oc

)

short current (

I

sc

)

maximum power (

P

m

)

fill factor (FF) and percentage of conversion efficiency (PCE) of the solar cell. Through contrast test and correction

this system has a maximum error of 0.18%. This system not only has a high degree of automation

but also has a high degree of accuracy and reliability. And it not only can be used in laboratory teaching

also can be used in the factory for solar cell and thin film transistor products performance testing.