基于相位测量偏折术的反射表面缺陷检测

陶迁; 周志峰; 吴明晖; 王立瑞

doi:10.37188/YJYXS20203512.1315

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基于相位测量偏折术的反射表面缺陷检测

图像处理 | 更新时间：2020-12-04

- 基于相位测量偏折术的反射表面缺陷检测
- Detection of reflective surface defects based on phase measuring deflectometry
- 液晶与显示 2020年35卷第12期页码：1315-1322
- 作者机构：
  
  上海工程技术大学机械与汽车工程学院, 上海 201620
- 作者简介：
  
  [ "陶迁(1995-), 男, 江苏淮安人, 硕士研究生, 2014年于宿迁学院获得学士学位, 主要从事机械设计及其自动化和机器视觉方面的研究。E-mail: t943436471@163.com" ]
  [ "周志峰(1978-), 男, 江苏常州人, 博士, 硕士生导师, 2007年于上海交通大学获得博士学位, 主要从事车辆自动导航驾驶方面的研究。E-mail:zhousjtu@126.com" ]
- 基金信息：
  
  上海市科学技术委员会科研基金(17511106700)
- DOI：10.37188/YJYXS20203512.1315
  中图分类号： TH741
- 收稿日期：2020-07-23，
  
  修回日期：2020-09-04，
  
  录用日期：2020-9-4，
  
  纸质出版日期：2020-12
- 稿件说明：
移动端阅览
陶迁, 周志峰, 吴明晖, 等. 基于相位测量偏折术的反射表面缺陷检测[J]. 液晶与显示, 2020,35(12):1315-1322.

Qian TAO, Zhi-feng ZHOU, Ming-hui WU, et al. Detection of reflective surface defects based on phase measuring deflectometry[J]. Chinese journal of liquid crystals and displays, 2020, 35(12): 1315-1322.
陶迁, 周志峰, 吴明晖, 等. 基于相位测量偏折术的反射表面缺陷检测[J]. 液晶与显示, 2020,35(12):1315-1322. DOI： 10.37188/YJYXS20203512.1315.

Qian TAO, Zhi-feng ZHOU, Ming-hui WU, et al. Detection of reflective surface defects based on phase measuring deflectometry[J]. Chinese journal of liquid crystals and displays, 2020, 35(12): 1315-1322. DOI： 10.37188/YJYXS20203512.1315.

摘要

针对机器视觉难以对反射表面进行缺陷检测等问题，本文提出一种基于相位测量偏折术的缺陷检测方法。该方法以LCD屏幕作为结构光源，格雷码图案结合相移图案作为结构光，通过LCD屏幕投射到被测表面，使用单目相机捕捉结构光的反射图案。首先对相机捕捉的图案逐个像素进行解码，获得包裹相位和条纹级数；然后进行相位展开并消除误差，生成绝对相位图像；再使用Canny算子对图像进行边缘检测，将投影区域与非投影区域分割；最后在投影区域内使用Canny算子检测出缺陷的边缘，实现表面缺陷的检测与定位。实验结果表明：在环境亮度较低且恒定的条件下，相位测量偏折术可高效检测出反射表面上具有形变特征的缺陷，精度为0.1 mm，基本满足对反射表面上多种缺陷进行高精度、高效率、低成本检测的要求。

Abstract

Aiming at the problem that machine vision is difficult to detect defects on reflective surfaces

a defect detection method based on phase measuring deflectometry is proposed in this paper. This method uses an LCD screen as a structured light source

Gray code pattern combined with phase shift pattern as structured light

which is projected onto the measured surface through the LCD screen

and monocular camera is used to capture the reflected pattern of the structured light. Firstly

the image captured by the camera is decoded pixel by pixel to obtain the wrapped phase and fringe order. Secondly

the absolute phase image is generated by unwrapping phase and eliminating the error. Thirdly

Canny operator is used to detect the edge of the image to segment the projected region and the unprojected region. Finally

Canny operator is used to detect the edge of defect in the projected region to realize the detection and location of surface defect. The experimental results show that under the condition of low and constant ambient brightness

phase measuring deflectometry can efficiently detect the defects with deformation characteristics on the reflecting surface

with an accuracy of 0.1 mm. It basically meets the requirements of high precision

high efficiency and low cost detection for various defects on the reflected surface.

关键词

Keywords

references

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