TFT-LCD边缘暗带不良机理研究与改善

马健; 孙福坤; 廖伟经; 黄正峰; 刘来峰; 翟承凯; 郭晓斌

doi:10.37188/YJYXS20203511.1134

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TFT-LCD边缘暗带不良机理研究与改善

器件物理及器件制备技术 | 更新时间：2020-10-30

- TFT-LCD边缘暗带不良机理研究与改善
- Mechanism research and improvement of edge dark band of TFT-LCD
- 液晶与显示 2020年35卷第11期页码：1134-1141
- 作者机构：
  
  合肥鑫晟光电科技有限公司, 安徽合肥 230012
- 作者简介：
  
  [ "马健(1993-), 男, 安徽马鞍山人, 硕士, 高级工程师, 2018年于武汉理工大学获得硕士学位, 主要从事产品漏光不良改善及彩膜工艺相关的研究。E-mail: jeromema@foxmail.com" ]
  [ "黄正峰(1982-), 男, 安徽阜阳人, 硕士, 2007年于华东理工大学获得硕士学位, 主要从事TFT-LCD液晶成盒及彩膜工艺相关的研究。E-mail:huangzhengfeng@boe.com.cn" ]
- 基金信息：
- DOI：10.37188/YJYXS20203511.1134
  中图分类号： TN141.9
- 收稿日期：2020-05-26，
  
  修回日期：2020-06-23，
  
  录用日期：2020-6-23，
  
  纸质出版日期：2020-11-05
- 稿件说明：
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马健, 孙福坤, 廖伟经, 等. TFT-LCD边缘暗带不良机理研究与改善[J]. 液晶与显示, 2020,35(11):1134-1141.

Jian MA, Fu-kun SUN, Wei-jing LIAO, et al. Mechanism research and improvement of edge dark band of TFT-LCD[J]. Chinese journal of liquid crystals and displays, 2020, 35(11): 1134-1141.
马健, 孙福坤, 廖伟经, 等. TFT-LCD边缘暗带不良机理研究与改善[J]. 液晶与显示, 2020,35(11):1134-1141. DOI： 10.37188/YJYXS20203511.1134.

Jian MA, Fu-kun SUN, Wei-jing LIAO, et al. Mechanism research and improvement of edge dark band of TFT-LCD[J]. Chinese journal of liquid crystals and displays, 2020, 35(11): 1134-1141. DOI： 10.37188/YJYXS20203511.1134.

摘要

针对薄膜晶体管液晶显示器（Thin Film Transistor-Liquid Crystal Display，TFT-LCD）边缘亮度偏低、出现暗带的不良现象，对不良机理及影响因子进行研究，并总结较优工艺条件。实验结果表明：从液晶面板设计角度，均匀的边缘盒厚有助于提升边缘亮度均一性，故适中的液晶量、硅球尺寸、硅球掺杂比及较硬的封框胶其性能更优，同时贴附偏光片后的液晶面板越平坦其暗带程度越轻；从背光源角度，模组成品的边缘暗带不良与背光源批次存在强相关性，但主要受背光源的平坦度等尺寸参数影响而非背光源自身的暗带程度。此外，老化工艺释放了背光源与液晶屏组装时产生的内应力，缓和边缘位置的形变，适当延长老化时间有利于降低边缘暗带不良发生率。通过以上较优条件的导入，成功改善了TFT-LCD显示器边缘暗带不良，有效地提升了产品竞争力。

Abstract

The undesirable phenomenon of edge dark band of TFT-LCD is introduced

the mechanism and influence factors are studied

and the optimum process parameters are concluded. The experimental results show that

from the perspective of panel design

the uniform thickness of edge cell gap is helpful to improve the uniformity of brightness in the edge area

and therefore the moderate amount of liquid crystal

the moderate size and doping ratio of silicon ball

and harder sealant are preferred. Meanwhile

the flatter the panel after polarizer attachment

the lighter the degree of dark band. From the perspective of backlight unit

the edge brightness uniformity of finished products has strong correlation with the batch of backlight. However

this is mainly related to the dimension parameters such as flatness of the backlight rather than the degree of dark band of the backlight. In addition

the aging process releases the internal stress generated during the assembly of backlight with panel

and alleviates the deformation at panel edge. Therefore extending the aging time appropriately is conducive to reduce the incidence of edge dark band. Through the application of optimum conditions

we have successfully improved the uniformity of edge brightness of our product and effectively enhanced its competitiveness.

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Keywords

references

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