制程停留时间对液晶显示器件影像残留的影响

苏子芳; 黄霞; 张少楠; 毛联波; 邱郁雯; 钟德镇; 简廷宪; 陆建钢

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制程停留时间对液晶显示器件影像残留的影响

器件物理及器件制备技术 | 更新时间：2020-08-12

- 制程停留时间对液晶显示器件影像残留的影响
- Q-Time Effect to TFT-LCD's Image Sticking
- 液晶与显示 2012年27卷第1期页码：70-74
- 作者机构：
  
  1. 昆山龙腾光电有限公司,江苏昆山 215301
  2. 江苏省(龙腾)平板显示技术研究院,江苏昆山,215301
  3. 上海交通大学电子信息与电气工程学院上海,200240
- 作者简介：
- 基金信息：
- DOI：
  中图分类号： TN141.9
- 收稿日期：2011-06-23，
  
  修回日期：2011-08-29，
  
  网络出版日期：2012-02-15，
  
  纸质出版日期：2012-02-15
- 稿件说明：
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苏子芳, 黄霞, 张少楠, 毛联波, 邱郁雯, 钟德镇, 简廷宪, 陆建钢. 制程停留时间对液晶显示器件影像残留的影响[J]. 液晶与显示, 2012,27(1): 70-74

SU Zi-fang, HUANG Xia, ZHANG Shao-nan, MAO Lian-bo, QIU Yu-wen, ZHONG De-zheng, JIAN Ting-xian, LU Jian-gang. Q-Time Effect to TFT-LCD's Image Sticking[J]. , 2012,27(1): 70-74
苏子芳, 黄霞, 张少楠, 毛联波, 邱郁雯, 钟德镇, 简廷宪, 陆建钢. 制程停留时间对液晶显示器件影像残留的影响[J]. 液晶与显示, 2012,27(1): 70-74 DOI：

SU Zi-fang, HUANG Xia, ZHANG Shao-nan, MAO Lian-bo, QIU Yu-wen, ZHONG De-zheng, JIAN Ting-xian, LU Jian-gang. Q-Time Effect to TFT-LCD's Image Sticking[J]. , 2012,27(1): 70-74 DOI：

摘要

引入加权分数的方法评价TFT-LCD的影像残留水平。将液晶盒前段成盒制程从配向膜印刷开始至框胶固化结束所经历的时间分为5部分。利用皮尔森相关系数及趋势图分别分析这5段时间与产品影像残留水平的相关性。分析结果显示

从摩擦配向后的水清洗结束到组立前的这段时间(Q3)与产品的影像残留有强相关性。进一步细化Q3后得出水清洗制程后不宜停留的结论

对实际生产具有指导性的作用。

Abstract

The level of TFT-LCD's image sticking is evaluated by introducing the weighted score. The period of pre-processing during liquid crystal cell assembly is divided into five parts from alignment film printing to sealant curing. The correlation between this five parts and image sticking is analyzed by Pearson Correlation Coefficient and trend chart

respectively. The analysis results showed the strong relationship between image sticking and the period of Q3 which is from rubbing cleaning to LC dispensing. After the detailed analysis of Q3

the conclusion is clear that the long keeping time after wet process is disadvantageous to decrease the level of image sticking. It has directed significance to real manufacture.

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references

Zhao H Y, You J, Ryu J L, et al. Photo-leakage current impact on image sticking //IDW'09 Digest, Miyazaki, Japan:IDW,2009: 69-72.[2] Mizusaki Masanobu, Nakanishi Yohei, Yoshimura Yohji, et al. Influence of ion on voltage holding ratio in LCD //IDW'08 Digest, Niigata, Japan:IDW,2008:39-42.[3] Ahn H J, Hwang H S, Kim D G, et al. Improvement of the long-term image sticking in an IPS-LCD by development of LCD cell materials //IDW'08 Digest, Niigata, Japan: IDW, 2008:1571-1572.[4] Murakami S, Naito H, Okuda M, et al. Transient photocurrent in amorphous selenium and nematic liquid crystal double layers [J]. J. Appl. Phys., 1995, 78(7): 4533-4537.[5] Zhang P, Zhao H Y, You J, et al. Line image sticking analysis on a-Si TFT LCD by changing the rubbing directions and DC bias //IDW'09 Digest, Miyazaki, Japan:IDW,2009: 65-68.[6] Masanobu Mizusaki, Tetsuya Miyashita, Tatsuo Uchida, et al. The mechanism of image sticking on LCD and its evaluation parameters related to LC and alignment materials //SID'06 Digest, San Francisco, USA:SID, 2006:673-676.[7] Kwak M, Kwon H, Han D, et al. Analysis of compare ion density with image sticking level on real TFT-LCD panels //IDW'10 Digest, Fukuoka, Japan:IDW,2010: 553-556.[8] Huang K T, Chao A, Yu C H, et al. Image sticking analysis of different Q-time LC cell by machine vision //SID'07 Digest, California, USA: SID,2007: 665-668.

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