Horizontal Line Mura is one kind of defect during TFT-LCD manufacturing process. This defect will affect display quality seriously. After analyzed the profile of the metal layer and measured the stress status of metal film

the root cause can be revealed. It shows that during deposition process of metal film on glass substrate

the stress of Mo layer different a lot between the center area and glass edge. And this caused the loose of Mo layer

which affect the capacitor between gate and source electrode. Then cause display voltage on pixel shifted. To solve this issue

adjust Gate layer stack ratio by remove bottom Mo layer is effective to reduce the failure rate. And this can be demonstrated by experiment.