ZHANG Jian-ping;WANG Rui-tao. Constant Stress Accelerated Life Tests and Statistical Analysis for VFD under Weibull Distribution Case[J]. 液晶与显示, 2010,25(2): 205-209
ZHANG Jian-ping;WANG Rui-tao. Constant Stress Accelerated Life Tests and Statistical Analysis for VFD under Weibull Distribution Case[J]. 液晶与显示, 2010,25(2): 205-209DOI:
In order to estimate the reliable lifetime of Vacuum Fluorescent Display (VFD) more accurately
and reduce testing time
four constant stress accelerated life tests (CSALT) were conducted by establishing accelerated life test model. The statistical analysis on test data was achieved by applying the Weibull model to describe the lifetime distribution
and Least Square Method (LSM) to estimate the Weibull parameters. Furthermore
accele-rated life equation was determined and self-developed software was employed to predict the VFD lifetime. The numerical results show that test design scheme of CSALT is correct and feasible
that the VFD lifetime follows Weibull distribution
that the life-stress relationship meets linear Arrhenius equation completely
and that the VFD failure mechanism keeps constant at each temperature stress. The proposed methods and the estimated reliable lifetime of VFD can provide some significant guideline to its manufacturers and technicians.
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