Sponsor:Changchun Institute of Optics, Fine Mechanics, and Physics (CIOMP), CAS, Liquid Crystal Branch, Chinese Physical Society, and Liquid Crystal Branch
Publication frequency:Monthly
Address:No.3888 Dong Nanhu Road, Changchun, Jilin, China 130033
LIU Xiaoqing, CHEN Pan, LI Linling, TENG Chao, REN Xiangkui
DOI:10.3724/CJLCD.2026-0131
摘要:To address the challenge of characterizing the thickness of polyimide (PI) alignment films in the peripheral display area of TFT-LCDs, a film thickness distribution characterization method based on time-of-flight secondary ion mass spectrometry (TOF-SIMS) depth analysis is proposed. An argon gas cluster ion beam(GCIB) was employed to sputter the inkjet-printed PI films at multiple micro-regions. The substrate-derived InO2 was selected as the characteristic ion, and the sputtering time corresponding to the 50% midpoint of its normalized signal intensity was defined as the breakthrough sputtering time t. The sputtering times across 17 micro-regions from the film edge to the central area were measured. Independent step profiler measurements of sputter crater depths and original film thicknesses were used for validation, together with a quantitative statistical analysis of the correlation between sputtering time and film thickness. The method was applied to four PI film samples prepared under different pre-baking conditions. The sputtering time obtained by the TOF-SIMS depth profiling method is highly consistent with the spatial distribution trend of the original film thickness measured by stylus profilometry(overall Spearman correlation coefficients of 0.571~0.963). Samples A and C, subjected to quiescent time, exhibited significant thickness anomalies in the edge region, with the maximum sputter times reaching 378 s and 487 s respectively, far exceeding the average of approximately 180 s. Samples B and D, without quiescent time, maintained uniform sputter times (~180 s) across the entire measured area. This method provides an effective analytical tool for the characterization of film uniformity across multiple microscopic regions, offering technical support for inkjet-printed PI alignment film process optimization and narrow-bezel panel manufacturing.
关键词:time-of-flight secondary ion mass spectrometry;depth profile;polyimide;liquid crystal alignment film;film thickness characterization;inkjet printing
ZHANG Chenying, YANG Zhe, ZHU Qingqi, LIU Liang, LI Sensen, CHEN Lujian
DOI:10.3724/CJLCD.2026-0132
摘要:Various achromatic planar optical elements, such as q-plates and polarization gratings, can be designed and fabricated based on the geometric phase of liquid crystals. The function of these optical elements heavily relies on the precise alignment of liquid crystal molecules. While digital micromirror device(DMD) exposure has been widely used for the photoalignment of liquid crystal geometric phase elements, its dimensional resolution is inherently limited by the micromirror pitch and the magnification of the projection lens. To address these limitations, this paper proposes a polarized laser direct writing (PLDW) system which integrates a scanning galvanometer with a displacement stage. The developed PLDW system achieves a high dimension resolution of 3.4 μm and demonstrates effective photoalignment capabilities. Utilizing this system, Pancharatnam-Berry(PB) gratings, lens and microlens arrays were fabricated. The fabricated PB grating exhibits a fine period of 27 μm and achieves a relative diffraction efficiency exceeding 85% under circularly polarized illumination. Furthermore, the PB lens demonstrated good focusing performance, and the microlens array successfully generated a clear image array of the mask pattern at a magnification of 1∶10. The proposed PLDW technique offers a high-precision and cost-effective solution for the photoalignment of liquid crystal geometric phase planar optical elements.
关键词:laser direct writing;photoalignment;geometric phase;Liquid crystal optical elements
LI Shilong, CHENG Hao, REN Yuting, FU Yuwei, HAO Wei, ZHAO Xinying, XING Hongyu, YE Wenjiang
DOI:10.3724/CJLCD.2026-0141
摘要:Conventional switchable liquid crystal(LC) gratings generally suffer from polarization sensitivity, poor continuous electrical tunability of the grating period, and slow response, which cannot meet the requirements for multi-dimensional and high precision light manipulation in complex optical systems. To address these drawbacks, this work adopts a flexoelectric LC mixture with a broad operating temperature range (0~65 ℃). Combined with patterned photoalignment, we fabricate a dual-mode switchable LC grating capable of continuous tuning of grating period, diffraction angle, and diffraction efficiency. The grating contains two periodic structures with markedly different feature sizes and can generate two distinct diffraction signals at different propagation distances. At zero applied voltage, transverse one-dimensional diffraction with small diffraction angles originating from the photo aligned pattern is observed. When the applied voltage exceeds 14 V, cross-stripe diffraction of large angles originating from the flexoelectric effect is activated. Within the voltage range of 14 V to 26 V, the grating period can be continuously tuned from 6.65 µm to 1.87 µm. The tuning for full range of period takes approximately 100 s, and the tuning speed is nearly 12 times higher than that of conventional light-driven cholesteric LC gratings. Meanwhile, the device exhibits weak polarization dependence and supports simultaneous continuous electrical modulation of grating period, diffraction angle, and diffraction efficiency. It features a simple fabrication procedure without elaborate patterned electrode structures. It holds promising application prospects in dynamic optical scenarios such as spectral scanning, adaptive beam shaping, and augmented reality displays, and provides a new technical route for the design of tunable LC optoelectronic devices.
关键词:flexoelectric effect;broad temperature range;continuous period tuning;mode-switching grating;patterned photoalignment
QIU Zihao, LI Shuang, YONG Jiali, SUN Yubao, MA Hongmei
DOI:10.3724/CJLCD.2026-0123
摘要:Flexoelectric effect is a critical factor causing image flicker in fringe-field switching liquid crystal displays(FFS-LCDs) under low-frequency driving, yet accurate measurement of flexoelectric coefficients ( remains challenging due to the ill-posed nature of single-parameter fitting. In this work, we propose a multi-physics co-fitting methodology that simultaneously matches the voltage-transmittance(V-T) curves and the transient transmittance responses under 1 Hz square-wave driving. Using TechWiz LCD 3D simulation software, the flexoelectric coefficients of two commercial negative nematic liquid crystals(LC-1 and LC-2) are accurately determined as ( and (, respectively, with simulation-experiment discrepancies below 0.25%. The study found that our systematic investigation reveals that the flicker magnitude correlates positively with the absolute difference rather than the individual coefficient values. When =, the flicker is minimized, providing a clear design guideline for low-power FFS-LCD development. This work establishes a robust measurement protocol for flexoelectric coefficients and uncovers the underlying physical mechanism linking coefficient asymmetry to frame-to-frame optical instability.