Research and improvement on ESD of TFT-LCD rubbing process

Rong-rong GAO; Bao-quan ZHOU; Qiao JIANG; Ling TENG; Wei-cheng CHEN; Ai-cui ZUO; Hong-guang GUO; Ji-tong HAN

doi:10.3788/YJYXS20203501.0048

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Research and improvement on ESD of TFT-LCD rubbing process

Materials and Devices | 更新时间：2020-07-05

- Research and improvement on ESD of TFT-LCD rubbing process
- Chinese Journal of Liquid Crystals and Displays Vol. 35, Issue 1, Pages: 48-52(2020)
- 作者机构：
  
  合肥京东方光电科技有限公司 Cell分厂, 安徽合肥 230012
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20203501.0048
  CLC： TN141.9
- Received：28 May 2019，
  
  Revised：17 October 2019，
  
  Accepted：17 October 2019，
  
  Published：05 January 2020
- 稿件说明：
移动端阅览
Rong-rong GAO, Bao-quan ZHOU, Qiao JIANG, et al. Research and improvement on ESD of TFT-LCD rubbing process[J]. Chinese journal of liquid crystals and displays, 2020, 35(1): 48-52.
DOI：

Rong-rong GAO, Bao-quan ZHOU, Qiao JIANG, et al. Research and improvement on ESD of TFT-LCD rubbing process[J]. Chinese journal of liquid crystals and displays, 2020, 35(1): 48-52. DOI： 10.3788/YJYXS20203501.0048.

摘要

摩擦工艺ESD（Electrostatic Discharge）是TFT-LCD制程中较为常见的一种不良，以317.5 mm（12.5 in）产品为例，摩擦工艺过程中ESD发生率20%，对产品良率影响较大。文章结合实际生产对摩擦工艺ESD的原因进行理论分析与实验验证，得出摩擦工艺发生ESD的原因为TFT基板上面有悬空的大块金属，在摩擦过程中电荷积累过多容易发生ESD，ESD进一步烧毁旁边金属电路导致面板点亮时画面异常。生产过程中通过工艺管控和产品设计两方面优化改善，工艺方面通过增加湿度，涂布防静电液以及管控摩擦布寿命进行改善，设计方面通过变更悬空的大块金属为小块金属，通过工艺设计优化最终生产过程中摩擦工艺ESD发生率由20%下降到0%，大大提高了产品品质，降低了生产成本。

Abstract

Electrostatic discharge(ESD) is a common defect in TFT-LCD rubbing process

For example

the ratio of ESD is 20% at 317.5 mm(12.5 in) product

it is a great influence on the yield of products. The causes of ESD in rubbing process is studied with the theoretical analysis and experiment. Experiments show that the main reason for ESD is that there are large floating metal on the TFT substrate. In rubbing process

the charge is easy to accumulate on the TFT substrate and burning down the electric circuit

so the panel is abnormal. ESD can be reduced through controlling rubbing process and optimizing design. In process

increasing humidity and coating electrostatic prevention and controlling the life time of rubbing cloth can improve ESD. In design

by changing the large floating metal into small floating metal

ESD can be improved. By optimizing the process and design

the ESD ratio is reduced from 20% to 0%

which greatly improves the panel quality and reduced the product cost.

关键词

Keywords

references

申智源 . TFT-LCD技术:结构、原理及制造技术 , : 北京电子工业出版社 , 2012 .

王新久 . 液晶光学和液晶显示 , : 北京科学出版社 , 2006 .

田民波 , 叶锋 . TFT液晶显示原理与技术 , : 北京科学出版社 , 2010 . 9 - 22 .

刘红红 , 张艳君 . 混合排列柱状薄层中的向列相液晶指向矢分布的研究 . 液晶与显示 , 2017 . 32 ( 1 ): 13 - 18 . http://yjyxs.com/CN/abstract/abstract10119.shtml http://yjyxs.com/CN/abstract/abstract10119.shtml .

LEE Y B, PARK K H, LEE S K. Comparison of the cell process margin at each LC modes[C] // Proceedings of IDW . Fukuoka, Japan, 2010: 123-148.

范恒亮 , 汤展峰 , 刘利萍 , 等 . TFT-LCD残影不良的研究与改善 . 液晶与显示 , 2016 . 31 ( 3 ): 270 - 275 . http://yjyxs.com/CN/abstract/abstract9986.shtml http://yjyxs.com/CN/abstract/abstract9986.shtml .

S H LEE , S M LEE , H Y KIM , 等 . 29.2:18.1" Ultra-FFS TFT-LCD with super image quality and fast response time . SID Symposium Digest of Technical Papers , 2001 . 32 ( 1 ): 484 - 487 . DOI: 10.1889/1.1831901 http://doi.org/10.1889/1.1831901 .

HH LIU , Y J ZHANG , H R YUE , 等 . Influence of flexoelectric effect on director alignment of nematic liquid crystals in axial arrangement cylindrical cells . Chinese Physics Letters , 2018 . 35 ( 2 ): 026103 DOI: 10.1088/0256-307X/35/2/026103 http://doi.org/10.1088/0256-307X/35/2/026103 .

D W ALLENDER , G P CRAWFORD , J W DOANE . Determination of the liquid-crystal surface elastic constant K24 . Physical Review Letters , 1991 . 67 ( 11 ): 1442 - 1445 . DOI: 10.1103/PhysRevLett.67.1442 http://doi.org/10.1103/PhysRevLett.67.1442 .

K BAKDEKER . Electrical conductivity and thermo-electromotive force of some metallic ampounds . Annals of Physics, (Leipzip) , 1997 . 22 ( 4 ): 749 - 766 .

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