TFT-LCD flicker influence factors and quantitative analysis method

Hai-peng ZHU; Hai-long WU; Yi DAN; Min RAN; Huan ZHOU; Jian-bo FU; Yan ZHOU; Tai-ye MIN

doi:10.3788/YJYXS20193412.1172

您当前的位置：

首页 >

文章列表页 >

TFT-LCD flicker influence factors and quantitative analysis method

Materials and Devices | 更新时间：2020-07-16

- TFT-LCD flicker influence factors and quantitative analysis method
- Chinese Journal of Liquid Crystals and Displays Vol. 34, Issue 12, Pages: 1172-1181(2019)
- 作者机构：
  
  京东方科技集团股份有限公司重庆京东方光电科技有限公司, 重庆 400700
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20193412.1172
  CLC： TN873.93
- Received：07 August 2019，
  
  Accepted：18 September 2019，
  
  Published：05 December 2019
- 稿件说明：
移动端阅览
Hai-peng ZHU, Hai-long WU, Yi DAN, et al. TFT-LCD flicker influence factors and quantitative analysis method[J]. Chinese journal of liquid crystals and displays, 2019, 34(12): 1172-1181.
DOI：

Hai-peng ZHU, Hai-long WU, Yi DAN, et al. TFT-LCD flicker influence factors and quantitative analysis method[J]. Chinese journal of liquid crystals and displays, 2019, 34(12): 1172-1181. DOI： 10.3788/YJYXS20193412.1172.

摘要

画面闪烁（Flicker）是TFT-LCD画面品质评价的重要指标。文章基于Δ

及闪烁发生机理，通过一系列实验，首先研究了

com

对闪烁的影响，结果表明

com

对闪烁具有显著影响；随着闪烁灰阶升高，最佳闪烁呈逐渐减小趋势，常白模式产品最佳闪烁对应

com

逐渐减小，而常黑模式产品最佳闪烁对应

com

逐渐增加。其次，研究了

、

对闪烁影响，结果表明

、

变化对闪烁均有显著影响；同一闪烁灰阶，

增加不会影响最佳闪烁，但对应

com

逐渐减小，而

增加最佳闪烁逐渐减小，但对应

com

逐渐增加。最后，提出一种可以预测不同灰阶闪烁水平的定量分析方法，通过该方法计算得到的闪烁水平与VESA标准下FMA测试法所得的闪烁值趋势一致，常白模式和常黑模式产品线性相关系数均达0.95以上，证明该方法可以用来预测不同灰阶闪烁水平。这些研究对改善TFT-LCD闪烁问题提供了分析方法和解决思路。

Abstract

Flicker is an important index of TFT-LCD image quality evaluation. Based on the mechanism of Δ

and flicker

the influence of

com

on flicker is studied

and the experiment results show that

com

has a significant impact on flicker. With the increase of flicker gray level

the optimum flicker tends to decrease gradually and its corresponding

com

for TN mode products decreases gradually

while ADS mode products increases gradually. Secondly

the article studied The impact of

and

on flicker is stadied

the results indicate that

and

have important impact on flicker. When flicker gray level is invariable

the

increase will not affect the optimal flicker

but the corresponding

com

decreases gradually. While the

increase the optimal flicker decreases gradually

but the corresponding V

com

increases gradually. A quantitative analysis method is proposed for predicting flicker scales of different gray level and proved that it can be used to predict the flicker scale of different gray level

because the calculated flicker is consistent with measurement flicker value by FMA test method under VESA standard

and the linear correlation coefficients are above 0.95 for both TN mode and ADS mode products. These studies provide analytical methods and solutions for improving TFT-LCD flicker problem.

关键词

Keywords

references

邵喜斌. TFT-LCD产业与技术进展[J].新材料产业, 2009(1):32-35.

SHAO X B. TFT-LCD industry and technology progress[J]. Advanced Materials Industry , 2009(1):32-35. (in Chinese)

SONM S, YOO K H, JANG J. Electrical simulation of the flicker in poly-Si TFT-LCD pixels for the large-area and high-quality TFT-LCD development and manufacturing[J]. Solid-State Electronics , 2004, 48(12):2307-2313.

田民波, 叶锋.TFT液晶显示原理与技术[M].北京:科学出版社, 2010:34-37.

TIAN M B, YE F. The Principle and Technology of TFT Liquid Crystal Display [M]. Beijing:The Science Publishing Company, 2010:34-37. (in Chinese)

LI C, YAN T, WANG L L. Investigation of flicker visibility in impulse type display[J]. Proceedings of Asia Display , 2007(1):264-267.

TAE H K, SOON S J, JAE W P, et al . Simulations of crosstalk and flicker in TFT-LCDs[J]. Journal of the Korean Physical Society , 2001, 39(1):67-71.

林鸿涛, 王明超, 姚之晓, 等. TFT-LCD中画面闪烁的机理研究[J].液晶与显示, 2013, 28(4):567-571.

LIN H T, WANG M C, YAO Z X, et al . Mechanism research about flicker in TFT-LCD[J]. Chinese Journal of Liquid Crystals and Displays , 2013, 28(4):567-571. (in Chinese)

张怀平. LCD液晶显示器画面闪烁解决方法探讨[J].电子技术与软件工程, 2016(8):119.

ZHANG H P. Discussion about flicker on the solution of LCD Screen[J]. Electronic Technology & Software Engineering , 2016(8):119. (in Chinese)

王明超, 姚之晓, 刘家荣, 等. TFT-LCD中 I off-p 与画面闪烁关系的研究[J].液晶与显示, 2013, 28(2):215-219.

WANG M C, YAO Z X, LIU J R, et al . Relationship between flicker and I off-p in TFT-LCD[J]. Chinese Journal of Liquid Crystals and Displays , 2013, 28(2):215-219. (in Chinese)

冯兰, 侯清娜, 王峥, 等.影响ADS面板闪烁漂移的因素研究[J].液晶与显示, 2015, 30(5):807-812.

FENG L, HOU Q N, WANG Z, et al . Influence factors on flicker shift for ADS LCD[J]. Chinese Journal of Liquid Crystals and Displays , 2015, 30(5):807-812. (in Chinese)

姚之晓, 王超明, 林鸿涛, 等. TFT漏电流对闪烁影响及测试方法研究[J].现代显示, 2012(10):32-36.

YAO Z X, WANG C M, LIN H T, et al . Experiments of TFT photo-leakage current impact on flicker[J]. Advanced Display , 2012(10):32-36. (in Chinese)

马群刚.TFT-LCD原理与设计[M].北京:电子工业出版社, 2011.

MA Q G. The Principle and Design of TFT-LCD [M]. Beijing:Publishing House of Electronics Industry, 2011. (in Chinese)

戴亚翔.TFT-LCD面板的驱动与设计[M].台北:五南图书出版股份有限公司, 2006.

DAI Y X. Design and Operation of TFT-LCD Panels [M]. Taibei, China:Wunan Book Publishing House, 2006. (in Chinese)

廖燕平, 宋勇志, 邵喜斌, 等.薄膜晶体管液晶显示器显示原理与设计[M].北京:电子工业出版社, 2016.

LIAO Y P, SONG Y Z, SHAO X B, et al . Thin Film Transistor Liquid Crystal Display [M]. Beijing:Publishing House of Electronics Industry, 2016. (in Chinese)

Views

146

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Mechanism research and improvement of edge dark band of TFT-LCD

Aquantitative analysis method for predicting vertical crosstalk level in TFT-LCD

Improvement research of TFT-LCD module black uniformity

Defect Related to Polarizer in TFT-LCD

Related Author

Xiao-bin GUO

Cheng-kai ZHAI

Lai-feng LIU

Zheng-feng HUANG

Wei-jing LIAO

Fu-kun SUN

Jian MA

Yan ZHOU

Related Institution

Hefei Xinsheng Optoelectronics Technology Co. Ltd.

Chongqing BOE Optoelectronics CO., LTD, BOE Technology Group CO., LTD

BOE Optoelectronics Technology CO., LTD

Beijing BOE Display Technology Co., Ltd., Beijing 100176, China

AI问答

Address：No.3888 Dong Nanhu Road, Changchun, Jilin, China 130033 Postal code：130033
Tel：0431-86176059 Email：yjxs@ciomp.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 吉ICP备11002662号-17 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.

⁰