Chao WANG, Xi-liang XU, Zhi-xiao YAO, et al. Analysis and improvement of bubble defect in TN mode liquid crystal panel[J]. Chinese journal of liquid crystals and displays, 2019, 34(7): 634-639.
DOI:
Chao WANG, Xi-liang XU, Zhi-xiao YAO, et al. Analysis and improvement of bubble defect in TN mode liquid crystal panel[J]. Chinese journal of liquid crystals and displays, 2019, 34(7): 634-639. DOI: 10.3788/YJYXS20193407.0634.
Analysis and improvement of bubble defect in TN mode liquid crystal panel
液晶显示面板中气泡不良是一种出现频率低但影响较大的缺陷。本文研究了一种TN型液晶显示面板出现的气泡不良,分析原因为彩色滤光片(Color Filter,CF)中平坦化层(Over Coat,OC)材料由于在高温条件下长时间存放,导致OC内气体大量析出,通过氧化铟锡(Indium Tin Oxide,ITO)裂缝释放到面板中形成气泡。文章从不良产生机理、不良改善进行研究,论证了通过优化工艺参数、变更OC工艺及材料减少气体发生,变更ITO成膜温度来降低ITO裂缝的发生,从而从源头解决此不良,保证产品品质,提升客户满意。
Abstract
Bubble in LCD panel is a defect with low frequency but great influence. In this paper
a kind of Bubble defect in TN LCD panel was explored. The reason is that the OC (Over Coat) material in the CF (Color Filter) is stored at high temperature for a long time
which results in a large amount of gas precipitation in the OC. It is released into the panel through the cracks of ITO (Indium Tin Oxide) and finally forms bubbles. The generation principle of the bubbles and the improvement methods of bubbles were researched in this paper. It is proved that the gas generation can be reduced by optimizing process parameters and replacing OC materials
and the ITO cracks can be reduced by changing the temperature of ITO film formation
so as to solve the problem from the source. That guarantees product quality and improves customer satisfaction.
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