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Analysis and improvement of bubble defect in TN mode liquid crystal panel
Materials and Devices | 更新时间:2020-07-05
    • Analysis and improvement of bubble defect in TN mode liquid crystal panel

    • Chinese Journal of Liquid Crystals and Displays   Vol. 34, Issue 7, Pages: 634-639(2019)
    • DOI:10.3788/YJYXS20193407.0634    

      CLC: TN141.9
    • Received:07 December 2018,

      Accepted:16 January 2019,

      Published:05 July 2019

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  • Chao WANG, Xi-liang XU, Zhi-xiao YAO, et al. Analysis and improvement of bubble defect in TN mode liquid crystal panel[J]. Chinese journal of liquid crystals and displays, 2019, 34(7): 634-639. DOI: 10.3788/YJYXS20193407.0634.

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