Failure mechanism and improvement of TFT-LCD Line Zara defect

Huan WANG; Xiang YU; Feng-zhi ZHU; Yan-xin SU; Wu-lin SHEN; Xin-bo YU; Xu LIU

doi:10.3788/YJYXS20193406.0549

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Failure mechanism and improvement of TFT-LCD Line Zara defect

Materials and Devices | 更新时间：2020-07-05

- Failure mechanism and improvement of TFT-LCD Line Zara defect
- Chinese Journal of Liquid Crystals and Displays Vol. 34, Issue 6, Pages: 549-555(2019)
- 作者机构：
  
  成都京东方光电科技有限公司, 四川成都 611731
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20193406.0549
  CLC： TN141.9
- Received：29 October 2018，
  
  Accepted：29 January 2019，
  
  Published：05 June 2019
- 稿件说明：
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Huan WANG, Xiang YU, Feng-zhi ZHU, et al. Failure mechanism and improvement of TFT-LCD Line Zara defect[J]. Chinese journal of liquid crystals and displays, 2019, 34(6): 549-555.
DOI：

Huan WANG, Xiang YU, Feng-zhi ZHU, et al. Failure mechanism and improvement of TFT-LCD Line Zara defect[J]. Chinese journal of liquid crystals and displays, 2019, 34(6): 549-555. DOI： 10.3788/YJYXS20193406.0549.

摘要

为了彻底改善TFT-LCD的Line Zara不良，本文建立了Line Zara失效模型，并分析了Line Zara失效机制，其中Line Zara发生率与外力大小及玻璃弯曲形变程度成正比，与框胶至柱状隔垫物距离、框胶粘结力成反比。基于Line Zara的失效机制，针对性地提出了改善措施并进行了实验验证。实验结果表明，减薄时的抛光工艺、减薄后运输箱的填充密度和框胶粘结力对Line Zara有显著的影响。随着抛光压力的减小和时间缩短，Line Zara发生率逐渐减少。随着运输箱中玻璃数量或隔垫物数量的增加，运输箱的填充密度逐渐增大，玻璃受外力发生的弯曲形变逐渐减小，相应的Line Zara发生率逐渐减小；当隔垫物为无尘纸时，玻璃的弯曲形变最小，Line Zara发生率最低。此外，当框胶与ITO粘结力增加12.5%、与PI粘结力增加66%后，Line Zara的发生率可降低至2%以下。TFT-LCD的Line Zara不良可通过降低抛光压力与时间、增加运输箱的填充密度和增加框胶粘结力彻底改善。

Abstract

In order to improve Line Zara defect thoroughly

the failure model of Line Zara was firstly built to analyze its failure mechanism. Analysis shows that Line Zara ratio is proportional to external force and glass bending deformation

and inversely proportional to sealant adhesive strength and distance from sealant to PS. Based on the failure mechanism

some improvements were specifically suggested and confirmed by experiments. The results show that the polishing process

packing density of transportation boxes after slimming and sealant adhesive strength have a significant effect on Line Zara ratio. The Line Zara ratio decreases with the decreasing of the polishing pressure and time. With the increasing of the number of glass or spacer in packing box

the packing density increases gradually

so the glass bending deformation decreases

which leads to Line Zara ratio's decrease. When the type of spacer is air-laid paper

the glasses in box have the smallest bending deformation

the Line Zara ratio is lowest. In addition

the Line Zara ratio can be reduced to less than 2% when the sealant adhesive strength increases by 12.5% with ITO and 66% with PI. The Line Zara defect can be effectively improved by decreasing polishing pressure and time

increasing the packing density of transportation box and the sealant adhesive strength.

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Keywords

references

高荣荣, 陈杰, 刘俊豪, 等. TN型产品Zara Domain理论研究与分析改善[J].液晶与显示, 2016, 31(3):242-248.

GAO R R, CHENG J, LIU J H, et al . Theory research and analysis of Zara Domain on TN mode[J]. Chinese Journal of Liquid Crystals and Display , 2016, 31(3):242-248. (in Chinese)

刘利萍, 吴涛, 刘俊豪, 等.小尺寸FFS产品Zara分析与改善研究[J].液晶与显示, 2014, 29(5):697-702.

LIU L P, WU T, LIU J H, et al . Analysis and improvement of small size FFS mode Zara defect[J]. Chinese Journal of Liquid Crystals and Display , 2014, 29(5):697-702. (in Chinese)

王海成, 董天松, 郑英花, 等. TFT-LCD制程中Zara点状不良的产生与改善研究[J].液晶与显示, 2013, 28(5):707-710.

WANG H C, DONG T S, ZHENG Y H, et al . Occurrence and improvement of Zara particle in TFT-LCD cell process[J]. Chinese Journal of Liquid Crystals and Display , 2013, 28(5):707-710. (in Chinese)

张龙, 陈霖冬, 江桥, 等.非接触式配向工艺(光配向工艺) Zara Particle不良产生机理分析及改善方向研究[J].电子世界, 2017, (11):117-119.

ZHANG L, CHEN L D, JIANG Q, et al . Research on non-contact alignment process (Optical alignment process) Zara particle defection mechanism analysis and improvement direction[J]. Electronic World , 2017, (11):117-119. (in Chinese)

范宇光, 李京鹏, 宋省勋, 等.液晶显示屏线性碎亮点的分析与改善对策[C]//2014中国平板显示学术会议论文集, 南京: 中国光学学会电子行业协会液晶分会, 中国物理学会液晶分会, 中国电子学会, 2014: 108-110.

FAN Y G, LI J P, SONG S X, et al . Analysis and improvement of linear bright spot of LCD[C]// Proceedings of the 2014 Chinese Academic Conference on Flat Panel Display , Nanjing: China Optics and Optoelectronics Manufactures Association LCB, LCD Branch of China Physics Society, China Electronics Society, 2014: 108-110. (in Chinese)

陈杰, 管礼志, 孟凡维, 等. TFT-LCD边角Zara Particle研究和改善[J].数字通信世界, 2015(8):188-189.

CHEN J, GUAN L Z, MENG F W, et al . Research and improvement of corner Zara Particl in TFT-LCD[J]. Digital Communication World , 2015(8):188-189. (in Chinese)

聂毓琴, 孟广伟.材料力学[M].第2版.北京:机械工业出版社, 2012:159-164.

NIE Y Q, MENG G W. Mechanics of Materials [M].2 nd .ed. Beijing:Machinery Industry Press, 2012:159-164. (in Chinese)

王绍华, 吴飞, 宣津, 等. TFT-LCD工艺中角落白Mura的成因机理研究与改善[J].液晶与显示, 2018, 33(7):583-589.

WANG S H, WU F, XUAN J, et al . Research and improvement of corner white Mura in TFT-LCD[J]. Chinese Journal of Liquid Crystals and Display , 2018, 33(7):583-589. (in Chinese)

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