The problem of vertical crosstalk caused by capacitive coupling and TFT leakage becomes particularly prominent in high-resolution TFT-LCD products

which greatly affects the yield of products. The industry usually uses VESA 2.0 standard to test crosstalk level by window patterns

but there is still no quantitative analysis method to predict crosstalk level. Based on the formation mechanism of vertical crosstalk. A quantitative analysis method for predicting the vertical crosstalk level was proposed in this paper

which can predict the most serious vertical crosstalk patterns of products with different display modes

and was conducive to better study and analyze the quality of products. Firstly

by analyzing the mechanism of vertical crosstalk

the qualitative correspondence between vertical crosstalk and source voltage difference was obtained. Secondly

by analyzing the

V

-

T

curve

the quantitative relationship between brightness variation|Δ

L

|under the window pattern and Source voltage difference|Δ

V

|can be obtained. The positive and negative source voltages corresponding to each gray level can be obtained through the output nodes on the PCB board. The corresponding points on the

V

-

T

curve can be found according to the corresponding source voltages of the gray level patterns and the corresponding slope

k

values can be obtained. According to the leakage mechanism

the corresponding source voltage difference|Δ

V

|can be calculated. If the leakage voltage drop coefficient is

α

there is the formula:|Δ

L

|=

kα

|Δ

V

|. The crosstalk value can be obtained by dividing|Δ

L

|by the brightness value of corresponding gray scale on

V

-

T

curve. The most serious crosstalk pattern can be obtained by comparing the crosstalk calculation values of different window patterns. Finally

compared with the VESA 2.0 standard method to test the vertical crosstalk level under different window patterns

the crosstalk variation trend calculated by this method can be fit well. The linear correlation coefficients in TN and ADS modes are 0.98 and 0.93 respectively. The results show that this method can be used for quantitatively studing the vertical crosstalk of products.