张龙, 陈霖东, 江桥, 等.非接触式配向工艺(光配向工艺)Zara Particle不良产生机理分析及改善方向研究[J].电子世界, 2017(11):117-119.

ZHANG L, CHEN L D, JIANG Q, et al . Principle and improving research of Zara Particle of non-contact rubbing process (Photo-Alignment process)[J]. Electronics World , 2017(11):117-119. (in Chinese)

申智源.TFT-LCD技术:结构、原理及制造技术[M].北京:电子工业出版社, 2012.

SHEN Z Y. TFT -LCD Technology:Structure , Principle and Manufacturing Techniques [M]. Beijing:Publishing House of Electronics Industry, 2012. (in Chinese)

张鹏, 马婷婷, 杨叶花, 等.液晶显示器Mura缺陷及测量方法浅析[J].电子测试, 2017(6):50-52.

ZHANG P, MA T T, YANG Y H, et al . Mura defect and measurement method of liquid crystal display[J]. Electronic Test , 2017(6):50-52. (in Chinese)

ZHANG W, SONG S H, LIJ, et al . Analysis of rubbing Mura in fringe field switching liquid crystal display[J]. SID Symposium Digest of Technical Papers , 2013, 44(1):1122-1125.

高荣荣, 姚成宜, 叶超前, 等.关于TN型TFT-LCD中周边Mura的分析与改善[J].电子世界, 2014(18):160.

GAO RR, YAO C Y, YE C Q, et al . Analysis and improvement of Edge Mura in TN type TFT-LCD[J]. Electronics World , 2014(18):160. (in Chinese)

石天雷, 杨国波, 刘亮, 等.ODF工艺用封框胶的研究[J].光电子技术, 2011, 31(3):211-214.

SHI T L, YANG G B, LIU L, et al . The research of sealant used in ODF process[J]. Optoelectronic Technology , 2011, 31(3):211-214. (in Chinese)

毕昕, 丁汉.TFT-LCD Mura缺陷机器视觉检测方法[J].机械工程学报, 2010, 46(12):13-19.

BI X, DING H. Machine vision inspection method of Mura defect for TFT-LCD[J]. Journal of Mechanical Engineering , 2010, 46(12):13-19. (in Chinese)

TSAI J Z, CHANG R S, LI TY. Detection of gap Mura in TFT LCDs by the interference pattern and image sensing method[J]. IEEE Transactions on Instrumentation and Measurement , 2013, 62(11):3087-3092.

桑胜光, 车晓盼, 王嘉黎, 等.高PPI ADS产品白Mura不良产生原理及改善研究[J].液晶与显示, 2016, 31(5):435-441.

SANG S G, CHE X P, WANG J L, et al . Principle and improving research of white mura defect in high PPI ADS product[J]. Chinese Journal of Liquid Crystals and Displays , 2016, 31(5):435-441. (in Chinese)