Improvement research of TFT-LCD module black uniformity

Xing-hua LI; Jun-ping BAO; Bing XU; Hao-yuan FAN

doi:10.3788/YJYXS20183304.0271

您当前的位置：

首页 >

文章列表页 >

Improvement research of TFT-LCD module black uniformity

Material and Device | 更新时间：2020-07-06

- Improvement research of TFT-LCD module black uniformity
- Chinese Journal of Liquid Crystals and Displays Vol. 33, Issue 4, Pages: 271-276(2018)
- 作者机构：
  
  成都京东方光电科技有限公司, 四川成都 611731
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20183304.0271
  CLC： TN141.9
- Received：06 November 2017，
  
  Accepted：20 December 2017，
  
  Published：05 April 2018
- 稿件说明：
移动端阅览
Xing-hua LI, Jun-ping BAO, Bing XU, et al. Improvement research of TFT-LCD module black uniformity[J]. Chinese journal of liquid crystals and displays, 2018, 33(4): 271-276.
DOI：

Xing-hua LI, Jun-ping BAO, Bing XU, et al. Improvement research of TFT-LCD module black uniformity[J]. Chinese journal of liquid crystals and displays, 2018, 33(4): 271-276. DOI： 10.3788/YJYXS20183304.0271.

摘要

随着显示行业发展，市场对液晶显示品质提出了更高的要求，特别是车载等领域，背光亮度几乎在10 000 cd/m

以上，此时显示装置的细微缺陷可能被凸显进而影响画面显示品质。黑态均匀性是液晶显示模组显示画质的重要指标，为提升液晶显示模组黑态均匀性，改善显示画质，特对可能造成黑态漏光的相应结构及设计进行研究。从液晶面板受外力方向，针对机构干涉及柔性电路板（FPC）应力两方面的影响因素设计实验，确定出利于提升黑态均匀性的设计方法或管控标准。实验结果表明，通过对背光及铁框平整度的管控及缓冲胶带优化可减少机构干涉应力，通过对FPC结构及外形设计优化可减少FPC弯折应力，通过玻璃厚度减薄及增大下偏光片尺寸可提升液晶面板抗变形能力，从而将模组黑态均匀性提升到80%以上。

Abstract

With the development of display industry

market has the higher requirement of products quality. Especially for vehicle display field

the brightness of backlight is almost more than 10000 cd/m

which may enlarge small defects in display screen to impact display quality. As black uniformity is a crucial characteristic of image quality

the investigation of the structure and designing of liquid crystal display module which can generate black light leakage have been in progress for optimizing uniformity of black state to achieve best display quality. Those experiments were designed on the basis of external forces for Panel

mechanism interference and FPC stress to catch optimum methods or control standards for best black uniformity. The experimental results show

the module black uniformity has been increased more than 80% by decreasing interference stress

which was implemented by controlling the flatness of backlight and metal frame

optimizing the design of buffer tape

decreasing bend stress by optimizing structure and shape design of FPC

improving panel's stress resistance ability by reducing panel thickness and increasing dimension of Polarizer.

关键词

Keywords

references

张鹏, 马婷婷, 杨叶花, 等.液晶显示器Mura缺陷及测量方法浅析[J].电子测试, 2017(6):50-52.

ZHANG P, MA T T, YANG Y H, et al. Mura defect and measurement method of liquid crystal display[J]. Electronic Test , 2017(6):50-52. (in Chinese)

郭程杰.液晶显示模组漏光不良现象的解决策略研究[J].商品与质量, 2017(14):14.

GUO C J. Study on resolutions of LCM light leakage defect[J]. The Merchandise and Quality , 2017(14):14. (in Chinese)

王志龙, 郑英花, 马亮, 等.L0周边Mura分析及其改善研究[J].液晶与显示, 2014, 29(5):668-673.

WANG Z L, ZHENG Y H, MA L, et al . Research and improvement of L0 side Mura[J]. Chinese Journal of Liquid Crystals and Displays , 2014, 29(5):668-673. (in Chinese)

胡伟, 穆洪杨, 谈宝权, 等.散射光弹性技术在化学钢化玻璃表面应力测量中的应用[J].玻璃与搪瓷, 2017, 45(5):29-33.

HU W, MU H Y, TAN B Q, et al . Measurement of surface stress of chemically strengthened glass by scattered light photoelasticity[J]. Glass & Enamel , 2017, 45(5):29-33. (in Chinese)

廖红波, 王婷, 何琛娟, 等.液晶盒双折射效应的测量与应用[J].大学物理, 2016, 35(8):44-47.

LIAO H B, WANG T, HE C J, et al . The measurement and application of the birefringence effect in liquid crystal cell[J]. College Physics , 2016, 35(8):44-47. (in Chinese)

王永超, 张志东, 周璇.向列相液晶弹性各向异性诱导液晶盒产生漏光的研究[J].液晶与显示, 2015, 30(6):949-959.

WANG Y C, ZHANG Z D, ZHOU X. Study of light leakage induced by the elastic anisotropy of the nematic liquid crystal[J]. Chinese Journal of Liquid Crystals and Displays , 2015, 30(6):949-959. (in Chinese)

YANG Y F, KIMAN K, QIN G K, et al . Simulation and experimental study on light leakage in ADS mode LCDs[J]. SID Symposium Digest of Technical Papers , 2014, 45(1):1251-1254.

WANG Y C, ZHANG Z D, ZHOU X. Light leakage induced by spontaneous distortion of the nematic director in bulk defect structures[J]. Journal of Display Technology , 2016, 12(4):402-411.

YOU J, JIA Q, YANG Y F, et al . Improvement of dark state light leakage in ADS mode LCDs[J]. SID Symposium Digest of Technical Papers , 2015, 46(1):1544-1547.

CHANG C C, LEU J, LIN M H, et al . Effects of localized warpage and stress on chip-on-glass packaging induced light leakage phenomenon in 13-inch TFT-LCD[J]. SID Symposium Digest of Technical Papers , 2009, 40(1):838-841.

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Mechanism research and improvement of edge dark band of TFT-LCD

TFT-LCD flicker influence factors and quantitative analysis method

Aquantitative analysis method for predicting vertical crosstalk level in TFT-LCD

Defect Related to Polarizer in TFT-LCD

Related Author

Xiao-bin GUO

Cheng-kai ZHAI

Lai-feng LIU

Zheng-feng HUANG

Wei-jing LIAO

Fu-kun SUN

Jian MA

Hai-long WU

Related Institution

Hefei Xinsheng Optoelectronics Technology Co. Ltd.

Chongqing BOE Optoelectronics Co., Ltd., BOE Technology Group Co., Ltd.

Chongqing BOE Optoelectronics CO., LTD, BOE Technology Group CO., LTD

Beijing BOE Display Technology Co., Ltd., Beijing 100176, China

AI问答

Address：No.3888 Dong Nanhu Road, Changchun, Jilin, China 130033 Postal code：130033
Tel：0431-86176059 Email：yjxs@ciomp.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 吉ICP备11002662号-17 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.

⁰