Research and improvement of particle defect in TFT-LCD industry

Guan-chao LI; Chao WANG; Wei HE; Kun LIU; Shui SHEN; Xiao-qiang ZENG

doi:10.3788/YJYXS20173210.0787

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Research and improvement of particle defect in TFT-LCD industry

Material Science | 更新时间：2020-08-12

- Research and improvement of particle defect in TFT-LCD industry
- Chinese Journal of Liquid Crystals and Displays Vol. 32, Issue 10, Pages: 787-793(2017)
- 作者机构：
  
  北京京东方显示技术有限公司CELL生产运营部, 北京 100176
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20173210.0787
  CLC： TN87
- Received：06 April 2017，
  
  Accepted：11 June 2017，
  
  Published：05 October 2017
- 稿件说明：
移动端阅览
Guan-chao LI, Chao WANG, Wei HE, et al. Research and improvement of particle defect in TFT-LCD industry[J]. Chinese journal of liquid crystals and displays, 2017, 32(10): 787-793.
DOI：

Guan-chao LI, Chao WANG, Wei HE, et al. Research and improvement of particle defect in TFT-LCD industry[J]. Chinese journal of liquid crystals and displays, 2017, 32(10): 787-793. DOI： 10.3788/YJYXS20173210.0787.

摘要

在TFT-LCD行业，异物对产品品质的影响约占95%，直接关系到企业效益。因此，如何有效控制异物影响成为业内各大企业不断探索的课题。本文分析了Cell异物的成因和分类，并通过人员作业改善、设备改善、原辅材改善、处理方法改善、环境改善、维修改善等方面研究了异物改善的方向。研究表明，技术手段升级和现场管理强化结合对异物不良改善有重要作用，使Cell异物不良整体降低0.84%。

Abstract

In the TFT-LCD industry

the impact on the quality of particle is about 95% and directly relates to the effectiveness of enterprises. Therefore

how to effectively control the impact of particle has become an ongoing topic in the industry. This paper analyzes the causes and classification of Cell particle

and studies the direction of particle through the improvement of operation

equipment

raw and auxiliary material

handling method

environment

repair and other aspects. The results show that the combination of technical means and site management have an important effect on the improvement of particle

and make Cell particle reduce 0.84%.

关键词

Keywords

references

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Related Institution

School of Information Engineering, Jiangxi University of Science and Technology

Department of Electronic Engineering, School of Electronic Information and Electronic Engineering, Shanghai JiaoTong University

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