Analysis and improvement of TFT-LCD edge light-leaking mechanism

Shuai-min JIAN; Yang XIE; Gao-fei XIA; Lu-biao SUN; Wei-xin MENG; Che SHEN; Jian GUO

doi:10.3788/YJYXS20173206.0455

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Analysis and improvement of TFT-LCD edge light-leaking mechanism

Material Science | 更新时间：2020-07-07

- Analysis and improvement of TFT-LCD edge light-leaking mechanism
- Chinese Journal of Liquid Crystals and Displays Vol. 32, Issue 6, Pages: 455-460(2017)
- 作者机构：
  
  鄂尔多斯市源盛光电有限责任公司, 内蒙古鄂尔多斯 017000
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20173206.0455
  CLC： TP394.1;TH691.9
- Received：20 December 2016，
  
  Accepted：28 February 2017，
  
  Published：05 June 2017
- 稿件说明：
移动端阅览
Shuai-min JIAN, Yang XIE, Gao-fei XIA, et al. Analysis and improvement of TFT-LCD edge light-leaking mechanism[J]. Chinese journal of liquid crystals and displays, 2017, 32(6): 455-460.
DOI：

Shuai-min JIAN, Yang XIE, Gao-fei XIA, et al. Analysis and improvement of TFT-LCD edge light-leaking mechanism[J]. Chinese journal of liquid crystals and displays, 2017, 32(6): 455-460. DOI： 10.3788/YJYXS20173206.0455.

摘要

目前，薄膜晶体管型液晶显示器（Thin-Film Technology Liquid Crystal Display，TFT-LCD）已成为显示领域的主流产品，而液晶面板是TFT-LCD的一个重要组成部分。LCD边缘漏光会导致画面失真，影响可视效果，造成画面显示品质下降、良率降低，因此改善边缘漏光成为急待解决的问题。本文研究了液晶与PI膜层取向异常对边角漏光的影响、LC Pattern设计对边角漏光的影响、Si-Ball型号对边角漏光的影响等，结果证明LC Pattern设计对边角漏光具有较好的改善效果，Pattern拉伸可改善边角漏光但更易造成液晶穿刺现象，小滴优化不仅能改善边角漏光而且也能防止液晶穿刺。另外小型Si-Ball对边角漏光改善效果最优，同时从信赖性验证等方面可以排除较小Si-Ball，限定出Si-Ball选择范围。

Abstract

At present

Thin Film Transistor Liquid Crystal Display (TFT-LCD

Thin-Film Technology Liquid Crystal Display) has become the mainstream in the field of Display products

and LCD panel is an important component of TFT-LCD. LCD edge light-leaking can cause image distortion

affect the visual effects

resulting in lower quality display screen and yield

thus improving the edge light-leaking become an urgent problem to be solved. This paper studies the influence of the abnormal orientation of liquid crystal and PI film on the edge light-leaking

the influence of LC Pattern design on edge light-leaking

and the influence of the Si-Ball edge light-leaking. The result illustrates the LC Pattern design for edge light-leaking improvement has a good effect

the pattern drawing is more likely to cause LCD puncture phenomenon

the droplet optimization can be relatively better. The effect of small Si-Ball on the edge light-leaking is the best. Meanwhile

we eliminated the smaller silicon ball by reliability verification and found the range of Si-Ball. Excluding small Si-Ball limits the choice of Si-Ball from the reliability of validation and others.

关键词

Keywords

references

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