Analysis and improvement of TN product pattern switching tide phenomenon

Ming TIAN; Yuan-yuan HAO; Ming-chao WANG; Yang SONG; Kan ZHANG; Hong-tao LIN; Xiao-peng CUI; Wei-tao CHEN

doi:10.3788/YJYXS20173201.0001

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Analysis and improvement of TN product pattern switching tide phenomenon

Material and Device | 更新时间：2020-07-07

- Analysis and improvement of TN product pattern switching tide phenomenon
- Chinese Journal of Liquid Crystals and Displays Vol. 32, Issue 1, Pages: 1-6(2017)
- 作者机构：
  
  北京京东方显示技术有限公司, 北京 100176
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20173201.0001
  CLC： TN873+
- Received：17 August 2016，
  
  Accepted：11 September 2016，
  
  Published：2017-01
- 稿件说明：
移动端阅览
Ming TIAN, Yuan-yuan HAO, Ming-chao WANG, et al. Analysis and improvement of TN product pattern switching tide phenomenon[J]. Chinese journal of liquid crystals and displays, 2017, 32(1): 1-6.
DOI：

Ming TIAN, Yuan-yuan HAO, Ming-chao WANG, et al. Analysis and improvement of TN product pattern switching tide phenomenon[J]. Chinese journal of liquid crystals and displays, 2017, 32(1): 1-6. DOI： 10.3788/YJYXS20173201.0001.

摘要

TN型LCD产品在由L255向L0切换瞬间经常出现一种潮汐现象。该现象表现为像素边缘液晶响应延迟，有短暂的局部漏光，对品质影响较大。为改善该不良进行了研究。首先，根据不良表现出来的规律性，明确了只有摩擦弱区并不能导致不良；接着，通过大量的实测数据及电学实验分析证明了侧向电场增大到一定程度后才能使不良发生。分析表明，不良是摩擦弱区和侧向电场共同作用的结果，通过优化像素电极和数据线与摩擦弱区的位置关系，不良由2.7%下降到0.3%左右。

Abstract

A tide phenomenon appears when TN-LCD switches from L255 to L0 which shows as the LC response delay at pixel edge and temporary light leakage

and it will affect the product quality seriously. In order to improve the defect we conduct a research. First

according to the regular performance

we confirm that rubbing shadow itself can not lead to defects. Then

we confirm that the defect appears when edge field intensity increases to a certain degree by large number of measured data and electrical experiments. The analysis shows that the defect is the result of the combined action of the rubbing shadow and edge field intensity

the defect ratio decrease from 2.7% to 0.3% by optimizing the relation between Pixel ITO and Data Line.

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Keywords

references

戴亚翔. TFT LCD面板的驱动与设计[M].北京:清华大学出版社,2008.

DAI Y X. Design and Operation of TFT LCD Panels[M]. Beijing:Tsinghua University Press, 2008. (in Chinese)

马群刚. TFT-LCD原理与设计[M].北京:电子工业出版社,2011.

MA Q G. Theory and Design of TFT-LCD[M]. Beijing:Electrical Industry Press, 2011. (in Chinese)

KAGAN C R,ANDRY P. 薄膜晶体管(TFT)及其在平板显示器中的应用[M].廖燕平,王军,译.北京:电子工业出版社,2008.

KAGAN C R, ANDRY P. Thin-Film Transistors[M]. LIAO Y P, WANG J, Trans. Beijing:Electrical Industry Press, 2008. (in Chinese)

季国平. 中国TFT-LCD产业的发展[J]. 现代显示, 2005(8):4-10.

JI G P. Development of TFT-LCD in China[J]. Advanced Display, 2005(8):4-10. (in Chinese)

罗丽平,贠向南,金基用. TFT-LCD生产及发展概况[J]. 现代显示, 2012(3):31-38.

LUO L P, YUN X N, JIN J Y. The manufacturing and developing of TFT-LCD[J]. Advanced Display, 2012(3):31-38. (in Chinese)

ZHANG W, SONG S H, ZHU H B, et al. Analysis of light leakage caused by photo spacer for fringe field switching liquid crystal display[C]//SID Symposium Digest of Technical Papers. USA:SID, 2012, 43(1):1243-1246.

车春城,王丹,李军建. TFT-LCD取向层工艺及其关键参数[J]. 现代显示, 2006(9):20-23,12.

CHE C C, WANG D, LI J J. TFT-LCD's oriented layer technology and it's key parameters[J]. Advanced Display, 2006(9):20-23, 12. (in Chinese)

艾雨,蒋学兵. 残影不良分析及改善对策研究[J]. 液晶与显示,2015,30(4):566-570.

AI Y, JIANG X B. Analysis and research of slow charging[J]. Chinese Journal of Liquid Crystals and Displays, 2015, 30(4):566-570. (in Chinese)

SEO D S, KOBAYASHI S, NISHIKAWA M. Study of the pretilt angle for 5CB on rubbed polyimide films containing trifluoromethyl moiety and analysis of the surface atomic concentration of F/C(%) with an electron spectroscope for chemical analysis[J]. Applied Physics Letters, 1992, 61(20):2392-2394.

BAN B S, KIM Y B. Materials and rubbing dependence on azimuthal anchoring energy of rubbed polyimide surfaces[J]. The Journal of Physical Chemistry B, 1999, 103(19):3869-3871.

马占洁. TFT-LCD中耦合电容Cpd影响因素的研究[J]. 现代显示,2008(8):30-34.

MA Z J. The study on the effective factor of coupling capacitor Cpd in TFT-LCD[J]. Advanced Display, 2008(8):30-34. (in Chinese)

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