Application of linear equations based on AOI logic operation

ZHANG Tie-yi; WANG He; GONG Wei; ZHU Yu; FANG Xin; SUN Guang-yan

doi:10.3788/YJYXS20153005.0883

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Application of linear equations based on AOI logic operation

Measurement Technology | 更新时间：2020-08-12

- Application of linear equations based on AOI logic operation
- Chinese Journal of Liquid Crystals and Displays Vol. 30, Issue 5, Pages: 883-887(2015)
- 作者机构：
  
  合肥鑫晟光电科技有限公司, 安徽合肥 230012
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20153005.0883
  CLC： TH865
- Received：12 December 2014，
  
  Revised：28 March 2015，
  
  Published：05 October 2015
- 稿件说明：
移动端阅览
张铁轶, 王贺, 龚伟, 朱宇, 方鑫, 孙广岩. 基于AOI逻辑运算的线性方程应用[J]. 液晶与显示, 2015,30(5): 883-887

ZHANG Tie-yi, WANG He, GONG Wei, ZHU Yu, FANG Xin, SUN Guang-yan. Application of linear equations based on AOI logic operation[J]. , 2015,30(5): 883-887
张铁轶, 王贺, 龚伟, 朱宇, 方鑫, 孙广岩. 基于AOI逻辑运算的线性方程应用[J]. 液晶与显示, 2015,30(5): 883-887 DOI： 10.3788/YJYXS20153005.0883.

ZHANG Tie-yi, WANG He, GONG Wei, ZHU Yu, FANG Xin, SUN Guang-yan. Application of linear equations based on AOI logic operation[J]. , 2015,30(5): 883-887 DOI： 10.3788/YJYXS20153005.0883.

摘要

自动光学检测系统采用周期性比较和逻辑运算的方法获取缺陷点的信息。但由于其最小周期比较Pitch存在小数

会造成比较对象的非正确选取。利用两点一线原理

可以构建一次线性方程使原来断点模拟成连续的点

达到无论比较距离是会否为整数

都能找到相对应的灰度值的效果。利用此方法可以提高异常点检出的准确度

同时会避免对产品产量、品质及成本的不利影响

具有重要意义。

Abstract

Method for automatic optical inspection system with periodic comparison and logic operation can obtain defect point information. Because of the existence of minimal cycle comparison of Pitch decimal

we cannot get the correct comparison. The use of two points formed one line

we can construct a linear equation to simulate the original breakpoints into continuous points. Just then

whether the comparative distance is an integer

the corresponding effect is found in the gray value. Using this method to improve the accuracy of anomaly check

the adverse effect is avoided on the yield

quality and cost of the product

which has the vital significance.

关键词

Keywords

references

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