Analysis and research of slow charging

AI Yu; JIANG Xue-bing

doi:10.3788/YJYXS20153004.0566

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Analysis and research of slow charging

Material Physics & Chemistry | 更新时间：2020-08-12

- Analysis and research of slow charging
- Chinese Journal of Liquid Crystals and Displays Vol. 30, Issue 4, Pages: 566-570(2015)
- 作者机构：
  
  合肥鑫晟光电科技有限公司,安徽合肥,中国,230012
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20153004.0566
  CLC： TP391.41
- Received：11 July 2014，
  
  Revised：02 September 2014，
  
  Published：05 August 2015
- 稿件说明：
移动端阅览
王春哲, 李杰, 李明晶, 郭盼. 一种多扭曲失真图像的质量评价方法[J]. 液晶与显示, 2015,30(4): 681-686

WANG Chun-zhe, LI Jie, LI Ming-jing, GUO Pan. Image quality assessment algorithm for multi-distorted image[J]. , 2015,30(4): 681-686
王春哲, 李杰, 李明晶, 郭盼. 一种多扭曲失真图像的质量评价方法[J]. 液晶与显示, 2015,30(4): 681-686 DOI： 10.3788/YJYXS20153004.0566.

WANG Chun-zhe, LI Jie, LI Ming-jing, GUO Pan. Image quality assessment algorithm for multi-distorted image[J]. , 2015,30(4): 681-686 DOI： 10.3788/YJYXS20153004.0566.

摘要

通过对大量残影不良样品进行分析

找到了残影不良产生的原因

并基于分析结果设计了改善残影的实验。通过分析发现:残影不良产生的原因是彩膜侧像素与黑矩阵之间的段差过大

在摩擦工程时段差过大区域形成了摩擦弱区

摩擦弱区内的液晶分子配向较弱

导致不良产生。为降低残影不良进行实验

结果显示:在彩膜侧加覆盖层可以有效降低残影不良的发生率

但不适用于量产;通过采用高预倾角的配向膜材料

同时控制配向膜工程到摩擦工程的时间

可使残影不良发生率由28.2%降低至0.2%

为企业的稳定高效生产奠定了基础。

Abstract

By analyzing massive slow charging samples

the cause of slow charging was found

and on this basis

experiments were designed to improve the defect.The analysis shows that the cause of slow charging was the large altitude variance between color filter pixel and black matrix

which would cause rubbing weak area in rubbing process.The result of experiments showed that adding over coat on color filter could obviously decrease slow charging

but it was not suitable for production.Furthermore

by using high pretilt angle polyemid

and controlling delay time between polyemid process and rubbing process

the slow charging ratio could be effectively decreased from 28.2% to 0.2%

laying the foundation for a stable and efficient production of enterprises.

关键词

Keywords

references

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