Design of OLED shorting bar testing waveform based on feed through voltage compensation principle

LIU Zhi-jun; HOU Hong-bing; LI Jin-tai; ZHAN Jia-hao

doi:10.3788/YJYXS20153002.0296

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Design of OLED shorting bar testing waveform based on feed through voltage compensation principle

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- Design of OLED shorting bar testing waveform based on feed through voltage compensation principle
- Chinese Journal of Liquid Crystals and Displays Vol. 30, Issue 2, Pages: 296-299(2015)
- 作者机构：
  
  1. 广州航海学院船舶工程系,广东广州,510725
  2. 惠州市仲恺高新技术投资控股有限公司,广东惠州,516006
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20153002.0296
  CLC： TN321+.5
- Received：21 March 2014，
  
  Revised：18 April 2014，
  
  Published：05 April 2015
- 稿件说明：
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刘志军, 侯红兵, 李金泰, 詹家豪. 基于馈通电压自动补偿的OLED电性能测试波形设计研究[J]. 液晶与显示, 2015,30(2): 296-299

LIU Zhi-jun, HOU Hong-bing, LI Jin-tai, ZHAN Jia-hao. Design of OLED shorting bar testing waveform based on feed through voltage compensation principle[J]. , 2015,30(2): 296-299
刘志军, 侯红兵, 李金泰, 詹家豪. 基于馈通电压自动补偿的OLED电性能测试波形设计研究[J]. 液晶与显示, 2015,30(2): 296-299 DOI： 10.3788/YJYXS20153002.0296.

LIU Zhi-jun, HOU Hong-bing, LI Jin-tai, ZHAN Jia-hao. Design of OLED shorting bar testing waveform based on feed through voltage compensation principle[J]. , 2015,30(2): 296-299 DOI： 10.3788/YJYXS20153002.0296.

摘要

常规馈通电压计算原理涉及到OLED体的电容值

不同型号OLED产品电容值是个变量

为了得到最佳的电容值

OLED制造企业测试部门需做大量的验证实验。本文直接通过栅极电压上拉使OLED体的储存电容产生馈通电压来补偿栅极电压关闭时栅极和漏极之间寄生电容产生的馈通电压

无需测量OLED体的电容值和修正

com

值即可补偿栅极电压关闭时栅极和漏极之间的寄生电容产生的馈通电压。实验结果表明

基于馈通电压自动补偿原理设计的Shorting Bar Test Waveform与V

com

人工修正原理设计的电性能测试波形的检测效果一致

而对不同缺陷的检测率有微小差异。

Abstract

The conventional calculation principle for the feed through voltage relates to capacitance values of OLED body

and capacitance values of different OLED products is variable. A lot of experiments must be done by testing department of OLED manufacturing enterprise in order to get the best capacitance values of OLED body. This paper directly pulls up gate voltage

and then the storage capacitor of OLED body produces a feed through voltage to compensate the feed through voltage generated by the parasitic capacitance between the gate and the drain as the gate voltage closing. Experiment result shows that the total detection rate using the testing waveform based on automatic compensation principle or conventional compensation is consistent

and there is little difference on the detection rate of different defects.

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references

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