Die burn of GOA type TFT LCD products during shorting Bar Testing

LIU Zhi-jun

doi:10.3788/YJYXS20153001.0051

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Die burn of GOA type TFT LCD products during shorting Bar Testing

Device Physics & Device Technology | 更新时间：2020-08-12

- Die burn of GOA type TFT LCD products during shorting Bar Testing
- Chinese Journal of Liquid Crystals and Displays Vol. 30, Issue 1, Pages: 51-56(2015)
- 作者机构：
  
  广州航海学院船舶工程系, 广东广州 510725
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20153001.0051
  CLC： TN321+.5
- Received：16 April 2014，
  
  Revised：18 May 2014，
  
  Published：05 February 2015
- 稿件说明：
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刘志军. GOA型TFT LCD产品Shorting Bar Testing工序烧伤现象研究[J]. 液晶与显示, 2015,30(1): 51-56

LIU Zhi-jun. Die burn of GOA type TFT LCD products during shorting Bar Testing[J]. , 2015,30(1): 51-56
刘志军. GOA型TFT LCD产品Shorting Bar Testing工序烧伤现象研究[J]. 液晶与显示, 2015,30(1): 51-56 DOI： 10.3788/YJYXS20153001.0051.

LIU Zhi-jun. Die burn of GOA type TFT LCD products during shorting Bar Testing[J]. , 2015,30(1): 51-56 DOI： 10.3788/YJYXS20153001.0051.

摘要

GOA型TFT LCD产品Shorting Bar testing工序烧伤现象严重

针对把根源归结为Shorting Bar Testing工序测试参数电压过高的假设

设计一个Source电压远高于理论测试电压的测试波形

分别以高压值参数和理论值参数对样品进行测试

结果发现两种情况下烧伤概率一样;针对把根源归结为Shorting Bar testing工序驱动程序启动瞬间冲击烧伤的假设

在测试驱动板上每个测试信号输入口加一个限流器

用加限流器和没加限流器的测试治具分别对样品进行测试

结果发现两者烧伤概率一样;针对把根源归结为静电击伤的假设

在Shorting Bar testing工序增加防静电措施

分别在改进前后的测试环境对样品进行测试

发现改进后未出现烧伤现象.可见出烧伤现象的根源在于静电

而非其他原因.

Abstract

Die burn probability of GOA TFT LCD product is very high in shorting bar testing. Testing waveforms with higher source voltage than the theory were designed. Testing samples were tested in two testing waveforms respectively. Experimental results showed that die burns probability is same in two testing waveforms. A current limiter is added on each testing signal output of testing driving plate. Testing samples were tested on two testing fixtures respectively

one loaded current limiter

the other not. Experimental results show that die burns probability is also same. Anti-static measures had been used to a shorting bar testing fixture. Testing samples were tested on two shorting bar testing fixtures

one with anti-static electrostatic measure

the other not. Experimental results show that die burns probability is zero using the anti-static electrostatic fixtures. Result of three experimental showed that the root cause of die burn is Electro-Static discharge.

关键词

Keywords

references

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