PI alignment inkjet printing Mura

WANG Dan; MA Guo-jing; SONG Yong-zhi; YUAN Jian-feng; SHAO Xi-bin

doi:10.3788/YJYXS20142906.0881

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PI alignment inkjet printing Mura

Table of contents | 更新时间：2020-08-12

- PI alignment inkjet printing Mura
- Chinese Journal of Liquid Crystals and Displays Vol. 29, Issue 6, Pages: 881-885(2014)
- 作者机构：
  
  北京京东方显示技术有限公司, 北京 100176
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20142906.0881
  CLC： TN141.9
- Received：18 February 2014，
  
  Revised：10 March 2014，
  
  Published：05 December 2014
- 稿件说明：
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王丹, 马国靖, 宋勇志, 袁剑峰, 邵喜斌. 印刷型设备产生配向膜Mura研究[J]. 液晶与显示, 2014,29(6): 881-885

WANG Dan, MA Guo-jing, SONG Yong-zhi, YUAN Jian-feng, SHAO Xi-bin. PI alignment inkjet printing Mura[J]. , 2014,29(6): 881-885
王丹, 马国靖, 宋勇志, 袁剑峰, 邵喜斌. 印刷型设备产生配向膜Mura研究[J]. 液晶与显示, 2014,29(6): 881-885 DOI： 10.3788/YJYXS20142906.0881.

WANG Dan, MA Guo-jing, SONG Yong-zhi, YUAN Jian-feng, SHAO Xi-bin. PI alignment inkjet printing Mura[J]. , 2014,29(6): 881-885 DOI： 10.3788/YJYXS20142906.0881.

摘要

薄膜晶体管行液晶显示（TFT-LCD）面板制造行业中，取向膜涂布方式主要有2种：一种为传统印刷方式辊式涂布法，另一种为新型印刷方式喷墨印刷法。本文通过对这2种印刷方式的比较，着重介绍了新型喷墨印刷法容易产生的三大主要不良（直线形不良、印刷头宽线形不良以及云状灰度不良）及产生原因。在对三大不良产生的原因进行详细的实验测试、数据分析和理论研究工作下，通过工艺调整并结合设备科学管控，最终使不良发生率大幅下降，极大地提高了产品的品质，并为今后新产品的开发及相关理论的研究提供了很好的基础。

Abstract

In the Thin Film Transistor Liquid Crystal Display(TFT-LCD) industry

there are two orientation film coating method.One traditional method is roller coating

the other one is inkjet printing.This paper introduces the new film coating method inkjet printing and the traditional method roller coating

especially introduces the new printing method.This paper introduces three defects caused by new printing method

such as line Mura

head Mura

and cloudy Mura. The intrinsic reason of these Mura is researched by analyzing many tests data and studying the theories

it also raises some improving measures and suggestions. By strengthening the scientific management of equipment and combining with the theory research

the ratio of these Mura drops obviously.What we have done also establish the basis for further analysis.

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Keywords

references

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