WANG Zhi-long, ZHENG Ying-hua, MA Liang, ZHU Zai-rong, SUN Peng, LIAO Yan-ping. Research and improvement of L 0 side Mura[J]. , 2014,29(5): 668-673 DOI: 10.3788/YJYXS20142905.0668.
L0 Side Mura is the common defect of TFT-LCD. After analyzing the stress status of panel surrounding area
the root cause can be revealed. It can be found that the stress distribution of glass substrate is quite uneven during cell assembly process
and this induced the deformation under the influence of smaller resultant force in local area
then caused cell gap fluctuating around the panel and generate defect. To solve this issue
dummy seal open mode was applied to make differential pressure between inside and outside the main seal on both sides into balance
which reduced the failure rate slightly lower. Nevertheless
the incidence of L0 Side Mura can be effectively reduced to 0.3% by improving dummy seal process to solve the problem of mechanics imbalance in certain. Furthermore
it will be avoided in development stage of new product through optimizing design scheme around Panel.
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references
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