Test and Improvement of Large Capacitor Load LCD Driver Chip

LI Tuo; LI Qi-fen; LI Fu-le; CHEN Zhi-liang

doi:10.3788/YJYXS20112605.0620

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Test and Improvement of Large Capacitor Load LCD Driver Chip

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- Test and Improvement of Large Capacitor Load LCD Driver Chip
- Chinese Journal of Liquid Crystals and Displays Vol. 26, Issue 5, Pages: 620-625(2011)
- 作者机构：
  
  清华大学微电子学研究所北京,100084
- 作者简介：
- 基金信息：
- DOI：10.3788/YJYXS20112605.0620
  CLC： TN27;TN702.2
- Received：31 May 2011，
  
  Revised：04 July 2011，
  
  Published Online：20 October 2011，
  
  Published：20 October 2011
- 稿件说明：
移动端阅览
李妥, 李奇奋, 李福乐, 陈志良. 大电容负载LCD驱动芯片的测试及性能改进[J]. 液晶与显示, 2011,26(5): 620-625

LI Tuo, LI Qi-fen, LI Fu-le, CHEN Zhi-liang. Test and Improvement of Large Capacitor Load LCD Driver Chip[J]. , 2011,26(5): 620-625
李妥, 李奇奋, 李福乐, 陈志良. 大电容负载LCD驱动芯片的测试及性能改进[J]. 液晶与显示, 2011,26(5): 620-625 DOI： 10.3788/YJYXS20112605.0620.

LI Tuo, LI Qi-fen, LI Fu-le, CHEN Zhi-liang. Test and Improvement of Large Capacitor Load LCD Driver Chip[J]. , 2011,26(5): 620-625 DOI： 10.3788/YJYXS20112605.0620.

摘要

提出了一种针对专用、多通道、大电容负载LCD驱动芯片的测试方案。通过FPGA为待测样片提供12.5 MHz的基本时钟、状态控制及帧频选择向量

并向数字部分寄存器写入递减数据

验证了芯片单路驱动200 pF容性负载时可以实现1 024级灰度、12 V摆幅输出。针对测试中出现的全摆幅上升时间较长及大输出幅度时的非线性问题

对芯片中的相关模块进行了测试分析

指出输出缓冲级对Miller电容的充电速度及数模转换器(DAC)对采样电容的充电速度是影响性能的关键因素

可通过适当减小片上转换电阻或采样电容来提高芯片性能。最后提出了一种使用开关电容型DAC及误差放大AB类输出驱动级电路的改进方案。

Abstract

This paper proposed a test scheme for a dedicated

multi-channel

large capacitor load LCD driver chip. The 12.5 MHz basic clock

control vectors for state change and frame frequency selection are provided by the FPGA

decreasing data is written to registers in the chip. With 200 pF capacitive load

the output signal range can realize 1 024 gray level and over 12 V voltage swing. Through testing the DAC and output buffer module in the chip

it is found that charging speed of the buffer to miller capacitor and the DAC to sampling capacitor cause the problem of longer full-swing rising/falling time and nonlinear output. It can be improved by reducing the on-chip convert resister or sampling capacitor to some extent. Finally

an improvement scheme is proposed

which uses switched-capacitor DAC and Class-AB output buffer error amplifier.

关键词

Keywords

references

孙洵.平板显示产业的发展现状和前景分析(液晶专题)[J]. 现代显示, 2007,(7):45-51.[2] 尹东辉,任彦楠,岳超,等.一种1 024级灰度、大电容负载的LCD显示驱动芯片设计[J]. 液晶与显示, 2011,26(1):78-82.[3] 林志诚,邵庆益,陈阿青.一种用于LCD驱动的低功耗输出缓冲放大器[J]. 液晶与显示, 2010,25(2):225-229.[4] 仇岩,魏廷存,王佳,等.一种基于控制PTAT电流的温度系数可调带隙基准源[J]. 液晶与显示, 2010,25(1):105-109.[5] Sansen W M C.Analog Design Essentials [M].Beijing:Tsinghua University Press,2006:177-179.[6] Allen P E,Holberg D R.CMOS Analog Circuit Design [M].Beijing:Science Press,1995:514-520.[7] Gral P R,Hurst P J,Lewis S H,et al.Analysis and Design of Analog Integrated Circuits [M].Fourth Edition.Beijing:Higher Education Press,2003:384-391.[8] Le H B,Do X D,Lee S G.Compact low-power high-slew-rate buffer for LCD driver applications [J].IEEE Electronics Letters,2010,46(20):1370-1371.[9] Woo J K,Shin D Y,Jeong D K,et al.High speed 10-bit LCD column driver with a split DAC and a class-AB output buffer[J].IEEE Transactions on Consumer Electronics,2009,55(3):1431-1438.

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